Silicon oxides and silicon nitrides: structure, properties and applications in memristors

2019 ◽  
Author(s):  
Vladimir A. Volodin ◽  
Gennadiy N. Kamaev ◽  
Vladimir N. Kruchinin ◽  
Vladimir A. Gritsenko
Keyword(s):  
Silicon Nitrides ◽  
Silicon Oxides ◽  
Structure Properties

Quantitative analysis of silicon oxide using EELS

1994 ◽  
Vol 52 ◽  
pp. 986-987
Author(s):  
M. J. Kim
Keyword(s):  
Quantitative Analysis ◽  
Silicon Oxide ◽  
Continuous Solid Solution ◽  
Band Gap Energy ◽  
Photonic Devices ◽  
Silicon Oxides ◽  
Analytical Technique ◽  
Spatially Resolved ◽  
Nanoscale Solids ◽  
Structure Properties

Silicon oxide exists as a continuous solid solution of Si and O (i.e., Si to SiO2), and its band gap energy (Eg) depends on the oxygen content in the system. Si is a semiconductor (Eg=1.1eV) but SiO2 is an insulator (Eg=9eV). Substoichiometric oxide SiOx, where 0<x<2, is a semi-insulator. With its extensive applications in electronic and photonic devices, quantitative analysis for the structure and composition of silicon oxide synthesized by various methods becomes increasingly important to understand its structure/properties relationships. EELS, when coupled to a TEM with a field emission source, is a powerful analytical technique for obtaining a host of spatially resolved information from nanoscale solids. In this paper, several examples of applications of high spatial resolution EELS for quantitative analysis of silicon oxides will be illustrated, with brief descriptions of experimental and data quantification procedure.

Trace nanoanalysis

1994 ◽  
Vol 52 ◽  
pp. 940-941
Author(s):  
D. E. Newbury ◽  
R. D. Leapman
Keyword(s):  
High Performance ◽  
Secondary Ion Mass Spectrometry ◽  
Detection Efficiency ◽  
Volume Element ◽  
And Performance ◽  
Trace Constituents ◽  
Secondary Ion ◽  
Concentration Levels ◽  
Structure Properties

Trace constituents, which can be very loosely defined as those present at concentration levels below 1 percent, often exert influence on structure, properties, and performance far greater than what might be estimated from their proportion alone. Defining the role of trace constituents in the microstructure, or indeed even determining their location, makes great demands on the available array of microanalytical tools. These demands become increasingly more challenging as the dimensions of the volume element to be probed become smaller. For example, a cubic volume element of silicon with an edge dimension of 1 micrometer contains approximately 5×1010 atoms. High performance secondary ion mass spectrometry (SIMS) can be used to measure trace constituents to levels of hundreds of parts per billion from such a volume element (e. g., detection of at least 100 atoms to give 10% reproducibility with an overall detection efficiency of 1%, considering ionization, transmission, and counting).

Advancing the use of Voronoi–Dirichlet polyhedra to describe interactions in organic molecular crystal structures by the example of galunisertib polymorphs

CrystEngComm ◽  
2021 ◽  
Author(s):  
Viktor N. Serezhkin ◽  
Anton V. Savchenkov
Keyword(s):  
Crystal Structures ◽  
Molecular Crystal ◽  
Noncovalent Interactions ◽  
Organic Molecular Crystal ◽  
Universal Approach ◽  
Structure Properties

The universal approach for studying structure/properties relationships shows that every polymorph of galunisertib is characterized with unique noncovalent interactions.

Synthetic Zeolites- Structure Properties and Application Area

2012 ◽  
Vol 3 (6) ◽  
pp. 78-80 ◽  
Author(s):  
Richa Gangele ◽  
◽  
Priya Pawaiya ◽  
Yogesh Pandey
Keyword(s):  
Application Area ◽  
Synthetic Zeolites ◽  
Structure Properties

NEW COMPLEXES OF 2-(1H-1, 2, 4-TRIAZOL-3-YL) PYRIDINE WITH Co(II), Cd(II), Rh(III), IONS: SYNTHESIS, STRUCTURE, PROPERTIES AND POTENTIAL APPLICATIONS

2015 ◽  
Vol 14 (2) ◽  
pp. 389-397
Author(s):  
Corneliu S. Stan ◽  
Petronela Horlescu ◽  
Daniel Sutiman ◽  
Carmen Mita ◽  
Cristian Peptu ◽  
...  
Keyword(s):  
Potential Applications ◽  
Structure Properties

Structural transformations in aluminum and silicon oxides in microwave fields

2020 ◽  
pp. 37-42
Author(s):  
O. N. Kanygina ◽  
◽  
M. M. Filyak ◽  
A. G. Chetverikova ◽  
◽  
...  
Keyword(s):  
Structural Transformations ◽  
Silicon Oxides

scholarly journals Advances in Rare‐Earth Tritelluride Quantum Materials: Structure, Properties, and Synthesis

2021 ◽  
pp. 2004762
Author(s):  
Kentaro Yumigeta ◽  
Ying Qin ◽  
Han Li ◽  
Mark Blei ◽  
Yashika Attarde ◽  
...  
Keyword(s):  
Rare Earth ◽  
Quantum Materials ◽  
Structure Properties

scholarly journals Three-Dimensional (3D) Laser-Induced Graphene: Structure, Properties, and Application to Chemical Sensing

2021 ◽  
Author(s):  
Federico Maria Vivaldi ◽  
Alexander Dallinger ◽  
Andrea Bonini ◽  
Noemi Poma ◽  
Lorenzo Sembranti ◽  
...  
Keyword(s):  
Chemical Sensing ◽  
Three Dimensional ◽  
Structure Properties
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