Structured illumination fiber probe for high-resolution surface feature imaging of 3D printed and composite samples

Author(s):  
Aswin Haridas ◽  
Murukeshan V.M.
Lab on a Chip ◽  
2021 ◽  
Author(s):  
Michel Moussus ◽  
Matthias Meier

High resolution live imaging promises new insights into the cellular and molecular dynamics of the plant root system in response to external cues. Microfluidic platforms are valuable analytical tools that...


2021 ◽  
Author(s):  
Imen Boujmil ◽  
Giancarlo Ruocco ◽  
Marco Leonetti

Super resolution techniques are an excellent alternative to wide field microscopy, providing high resolution also in (typically fragile) biological sample. Among the various super resolution techniques, Structured Illumination Microscopy (SIM) improve resolution by employing multiple illumination patterns to be deconvolved with a dedicated software. In the case of blind SIM techniques, unknown patterns, such as speckles, are used, thus providing super resolved images, nearly unaffected by aberrations with a simplified experimental setup. Scattering Assisted Imaging, a special blind SIM technique, exploits an illumination PSF (speckle grains size), smaller than the collection PSF (defined by the collection objectives), to surpass the typical SIM resolution enhancement. However, if SAI is used, it is very difficult to extract the resolution enhancement form a priori considerations. In this paper we propose a protocol and experimental setup for the resolution measurement, demonstrating the resolution enhancement for different collection PSF values.


Lab on a Chip ◽  
2021 ◽  
Author(s):  
Eiyong Park ◽  
Sungjoon Lim

RF electronics is inkjet-printed directly onto a 3D printed microfluidic structure using surface modification for the high conductivity, high resolution, and enhanced the interaction between a RF part and a fluid material.


2016 ◽  
Vol 10 (3) ◽  
pp. 1161-1179 ◽  
Author(s):  
Alek A. Petty ◽  
Michel C. Tsamados ◽  
Nathan T. Kurtz ◽  
Sinead L. Farrell ◽  
Thomas Newman ◽  
...  

Abstract. We present an analysis of Arctic sea ice topography using high-resolution, three-dimensional surface elevation data from the Airborne Topographic Mapper, flown as part of NASA's Operation IceBridge mission. Surface features in the sea ice cover are detected using a newly developed surface feature picking algorithm. We derive information regarding the height, volume and geometry of surface features from 2009 to 2014 within the Beaufort/Chukchi and Central Arctic regions. The results are delineated by ice type to estimate the topographic variability across first-year and multi-year ice regimes. The results demonstrate that Arctic sea ice topography exhibits significant spatial variability, mainly driven by the increased surface feature height and volume (per unit area) of the multi-year ice that dominates the Central Arctic region. The multi-year ice topography exhibits greater interannual variability compared to the first-year ice regimes, which dominates the total ice topography variability across both regions. The ice topography also shows a clear coastal dependency, with the feature height and volume increasing as a function of proximity to the nearest coastline, especially north of Greenland and the Canadian Archipelago. A strong correlation between ice topography and ice thickness (from the IceBridge sea ice product) is found, using a square-root relationship. The results allude to the importance of ice deformation variability in the total sea ice mass balance, and provide crucial information regarding the tail of the ice thickness distribution across the western Arctic. Future research priorities associated with this new data set are presented and discussed, especially in relation to calculations of atmospheric form drag.


2014 ◽  
Vol 7 (1) ◽  
pp. 015002 ◽  
Author(s):  
Helena N Chia ◽  
Benjamin M Wu
Keyword(s):  

Sign in / Sign up

Export Citation Format

Share Document