Full automatic test environment for high-throughput PIC testing

2019 ◽  
Author(s):  
Colin Dankwart ◽  
Moritz Seyfried ◽  
Torsten Vahrenkamp
Keyword(s):  
High Throughput ◽  
Automatic Test ◽  
Test Environment

scholarly journals Design and Implement of Automatic Test Environment for ETCS On-board Equipment

2020 ◽  
Vol 1570 ◽  
pp. 012030
Author(s):  
Xue Renpu ◽  
Geng Hongliang ◽  
Ke Changbo ◽  
Yang Kai
Keyword(s):  
Automatic Test ◽  
Test Environment

scholarly journals ProTest: An Automatic Test Environment for B Specifications

2005 ◽  
Vol 111 ◽  
pp. 113-136 ◽  
Author(s):  
Manoranjan Satpathy ◽  
Michael Leuschel ◽  
Michael Butler
Keyword(s):  
Automatic Test ◽  
Test Environment

scholarly journals An automatic test environment for microelectronics education and research

2008 ◽  
Vol 6 (01) ◽  
Author(s):  
Federico Sandoval-Ibarra
Keyword(s):  
Experimental Data ◽  
Integrated Circuits ◽  
Data Storage ◽  
Graduate Program ◽  
Electrical Characterization ◽  
Mos Transistors ◽  
Automatic Test ◽  
Test Environment ◽  
Current Voltage

An automatic test environment (ATE) based on a PSoC has been developed to perform electrical characterization of integrated circuits (ICs). The ICs are designed for academic and research purposes as part of the Electronic Design graduate program at NVESTAV-Guadalajara Unit; these ICs are manufactured in standard N-well, 5-V, 1.5μm/0.5μm CMOS technologies. The ATE offers programmable capabilities to develop master-slave architectures, memory for data storage, functions generator to stimulate circuits and systems, current/voltage sources for several purposes, current-voltage measurements, and ports to download experimental data to a PC. To date, several ICs have been tested with the help of the ATE. In this paper, however, examples based on MOS Transistors only are presented in order to describe the ATE performance and also to show how experimental data of the devices under characterization were validated through SPICE simulations, experimental data given by manufacturers, and using commercial equipment as well.

Correlation between dislocation, grain boundary and interface of duplex SS in stress corrosion cracking(SCC)

1990 ◽  
Vol 48 (4) ◽  
pp. 928-929
Author(s):  
Wang Zheng-fang ◽  
Z.F. Wang
Keyword(s):  
Stainless Steel ◽  
Thermal Cycle ◽  
Secondary Phase ◽  
Corrosion Cracking ◽  
Coarse Grained ◽  
Test Environment ◽  
Fine Grained ◽  
Evaluation Test ◽  
Welding Thermal Cycle ◽  
Micro Analysis

The main purpose of this study highlights on the evaluation of chloride SCC resistance of the material,duplex stainless steel,OOCr18Ni5Mo3Si2 (18-5Mo) and its welded coarse grained zone(CGZ).18-5Mo is a dual phases (A+F) stainless steel with yield strength:512N/mm2 .The proportion of secondary Phase(A phase) accounts for 30-35% of the total with fine grained and homogeneously distributed A and F phases(Fig.1).After being welded by a specific welding thermal cycle to the material,i.e. Tmax=1350°C and t8/5=20s,microstructure may change from fine grained morphology to coarse grained morphology and from homogeneously distributed of A phase to a concentration of A phase(Fig.2).Meanwhile,the proportion of A phase reduced from 35% to 5-10°o.For this reason it is known as welded coarse grained zone(CGZ).In association with difference of microstructure between base metal and welded CGZ,so chloride SCC resistance also differ from each other.Test procedures:Constant load tensile test(CLTT) were performed for recording Esce-t curve by which corrosion cracking growth can be described, tf,fractured time,can also be recorded by the test which is taken as a electrochemical behavior and mechanical property for SCC resistance evaluation. Test environment:143°C boiling 42%MgCl2 solution is used.Besides, micro analysis were conducted with light microscopy(LM),SEM,TEM,and Auger energy spectrum(AES) so as to reveal the correlation between the data generated by the CLTT results and micro analysis.

154: Integration of TPSA and High-Throughput Mass Spectrometry Data Improves Prostate Cancer Prediction

2007 ◽  
Vol 177 (4S) ◽  
pp. 52-53
Author(s):  
Stefano Ongarello ◽  
Eberhard Steiner ◽  
Regina Achleitner ◽  
Isabel Feuerstein ◽  
Birgit Stenzel ◽  
...  
Keyword(s):  
Prostate Cancer ◽  
Mass Spectrometry ◽  
High Throughput ◽  
Mass Spectrometry Data ◽  
Cancer Prediction
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