A computational imaging approach for resolution enhancement in fiber bundle endomicroscopy

2019 ◽  
Author(s):  
John Paul Dumas ◽  
Muhammad A. Lodhi ◽  
Batoul A. Taki ◽  
Waheed U. Bajwa ◽  
Mark C. Pierce
2017 ◽  
Vol 6 (1) ◽  
Author(s):  
Henrik Lietz ◽  
M. Muneeb Hassan ◽  
Jörg Eberhardt

AbstractSensor resolution of 3D time-of-flight (ToF) outdoor-capable cameras is strongly limited because of its large pixel dimensions. Computational imaging permits enhancement of the optical system’s resolving power without changing physical sensor properties. Super-resolution (SR) algorithms superimpose several sub-pixel-shifted low-resolution (LR) images to overcome the system’s limited spatial sampling rate. In this paper, we propose a novel opto-mechanical system to implement sub-pixel shifts by moving an optical lens. This method is more flexible in terms of implementing SR techniques than current sensor-shift approaches. In addition, we describe a SR observation model that has been optimized for the use of LR 3D ToF cameras. A state-of-the-art iteratively reweighted minimization algorithm executes the SR process. It is proven that our method achieves nearly the same resolution increase as if the pixel area would be halved physically. Resolution enhancement is measured objectively for amplitude images of a static object scene.


2019 ◽  
Vol 27 (11) ◽  
pp. 15880 ◽  
Author(s):  
Jianbo Shao ◽  
Junchao Zhang ◽  
Rongguang Liang ◽  
Kobus Barnard

2013 ◽  
Vol 80 (10) ◽  
Author(s):  
Muhammad Atif ◽  
Bernd Jähne

AbstractWe present a computational imaging approach to estimate the depth from a single image using axial chromatic aberrations. It includes a co-design of optics and digital processing to select the optimal parameters of a lens such as focal length,


2018 ◽  
Vol 43 (8) ◽  
pp. 1906 ◽  
Author(s):  
Jianbo Shao ◽  
Wei-Chen Liao ◽  
Rongguang Liang ◽  
Kobus Barnard

Author(s):  
J.K. Weiss ◽  
M. Gajdardziska-Josifovska ◽  
M. R. McCartney ◽  
David J. Smith

Interfacial structure is a controlling parameter in the behavior of many materials. Electron microscopy methods are widely used for characterizing such features as interface abruptness and chemical segregation at interfaces. The problem for high resolution microscopy is to establish optimum imaging conditions for extracting this information. We have found that off-axis electron holography can provide useful information for the study of interfaces that is not easily obtained by other techniques.Electron holography permits the recovery of both the amplitude and the phase of the image wave. Recent studies have applied the information obtained from electron holograms to characterizing magnetic and electric fields in materials and also to atomic-scale resolution enhancement. The phase of an electron wave passing through a specimen is shifted by an amount which is proportional to the product of the specimen thickness and the projected electrostatic potential (ignoring magnetic fields and diffraction effects). If atomic-scale variations are ignored, the potential in the specimen is described by the mean inner potential, a bulk property sensitive to both composition and structure. For the study of interfaces, the specimen thickness is assumed to be approximately constant across the interface, so that the phase of the image wave will give a picture of mean inner potential across the interface.


2006 ◽  
Vol 55 (2) ◽  
pp. 224-229 ◽  
Author(s):  
Takao OTA ◽  
Hikaru YOSHIZUMI ◽  
Hirokazu TSUCHIHASHI ◽  
Takashi MATSUOKA ◽  
Kazuhiko SAKAGUCHI

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