Optoelectronic integrated circuits for growing datacenters: challenge, strategy, and evolution

2019 ◽  
Author(s):  
Xiaolu Song ◽  
Rui Li ◽  
Guangcan Mi ◽  
Jing Suo ◽  
Zecen Zhang ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Optoelectronic Integrated Circuits

Scanned tip measurement of deep vertical facets on a flat surface: Measuring roughness on gaas laser waveguide mirrors

1993 ◽  
Vol 51 ◽  
pp. 532-533
Author(s):  
Chang Shen ◽  
Phil Fraundorf ◽  
Robert W. Harrick
Keyword(s):  
Integrated Circuits ◽  
Flat Surface ◽  
Scanning Force Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Optoelectronic Integrated Circuits ◽  
Laser Waveguide ◽  
Scanning Force ◽  
Gaas Laser

Monolithic integration of optoelectronic integrated circuits (OEIC) requires high quantity etched laser facets which prevent the developing of more-highly-integrated OEIC's. The causes of facet roughness are not well understood, and improvement of facet quality is hampered by the difficulty in measuring the surface roughness. There are several approaches to examining facet roughness qualitatively, such as scanning force microscopy (SFM), scanning tunneling microscopy (STM) and scanning electron microscopy (SEM). The challenge here is to allow more straightforward monitoring of deep vertical etched facets, without the need to cleave out test samples. In this presentation, we show air based STM and SFM images of vertical dry-etched laser facets, and discuss the image acquisition and roughness measurement processes. Our technique does not require precision cleaving. We use a traditional tip instead of the T shape tip used elsewhere to preventing “shower curtain” profiling of the sidewall. We tilt the sample about 30 to 50 degrees to avoid the curtain effect.

Complementary transistor technology for use in optoelectronic integrated circuits

1993 ◽  
Vol 140 (4) ◽  
pp. 279
Author(s):  
P.A. Kiely ◽  
G.W. Taylor ◽  
D.P. Docter ◽  
P.A. Evaldsson ◽  
T.A. Vang ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Optoelectronic Integrated Circuits

scholarly journals In-Plane Detection of Guided Surface Plasmons for High-Speed Optoelectronic Integrated Circuits

2017 ◽  
Vol 3 (1) ◽  
pp. 1700196 ◽  
Author(s):  
Evgeniy Panchenko ◽  
Jasper J. Cadusch ◽  
Ori Avayu ◽  
Tal Ellenbogen ◽  
Timothy D. James ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Surface Plasmons ◽  
High Speed ◽  
Optoelectronic Integrated Circuits

Silicon optoelectronic integrated circuits for MOEMS

2000 ◽  
Author(s):  
Dana Cristea ◽  
Florea Craciunoiu ◽  
M. F. Caldararu
Keyword(s):  
Integrated Circuits ◽  
Optoelectronic Integrated Circuits
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