Structural and optical characterization of the high quality Be-doped InAs epitaxial layer grown on GaAs substrate

2018 ◽  
Author(s):  
Jarosław Wróbel ◽  
Kacper Grodecki ◽  
Djalal Benyahia ◽  
Jacek Boguski ◽  
Krzysztof Murawski ◽  
...  
Keyword(s):  
Epitaxial Layer ◽  
Gaas Substrate ◽  
Optical Characterization ◽  
High Quality

Synthesis and optical characterization of a high-quality ZnS substrate for optoelectronics and UV solar-energy conversion

RSC Advances ◽  
2016 ◽  
Vol 6 (84) ◽  
pp. 81053-81059 ◽  
Author(s):  
Ching-Hwa Ho ◽  
Min-Han Lin
Keyword(s):  
Solar Energy ◽  
Energy Conversion ◽  
Optical Characterization ◽  
Band Edge ◽  
Band Edge Emission ◽  
High Grade ◽  
Edge Emission ◽  
High Quality ◽  
Strong Band

A high-grade cubic ZnS substrate crystal with longer range order and a strong band-edge emission was clearly demonstrated.

MOCVD growth and optical characterization of CdS and ZnCdS epilayers on GaAs substrate

2002 ◽  
Author(s):  
Jiying Zhang ◽  
Zhenzhong Zhang ◽  
C. X. Shan ◽  
De Z. Shen ◽  
Yichun Liu ◽  
...  
Keyword(s):  
Gaas Substrate ◽  
Optical Characterization ◽  
Mocvd Growth

Optical Characterization of Ultra-Thin InAs Strain-Layer Quantum Wells Grown on (511) GaAs Substrate

1993 ◽  
Vol 326 ◽  
Author(s):  
Weimin Zhou ◽  
H. Shen ◽  
M.W. Cole ◽  
D. Miller ◽  
M. Dutta
Keyword(s):  
Quantum Wells ◽  
Gaas Substrate ◽  
Optical Characterization ◽  
Strain Layer

Growth and optical characterization of high-quality GaN nanobelts

2005 ◽  
Vol 283 (3-4) ◽  
pp. 418-424 ◽  
Author(s):  
M. Zhao ◽  
X.L. Chen ◽  
J.K. Jian ◽  
X.N. Zhang ◽  
H.Z. Zhao ◽  
...  
Keyword(s):  
Optical Characterization ◽  
High Quality

Growth, structure and optical characterization of high quality ZnO thin films obtained by spray pyrolysis

1999 ◽  
Vol 350 (1-2) ◽  
pp. 192-202 ◽  
Author(s):  
F. Paraguay D. ◽  
W. Estrada L. ◽  
D.R. Acosta N. ◽  
E. Andrade ◽  
M. Miki-Yoshida
Keyword(s):  
Thin Films ◽  
Spray Pyrolysis ◽  
Optical Characterization ◽  
Zno Thin Films ◽  
High Quality ◽  
Growth Structure

New procedure for the optical characterization of high-quality thin films

2000 ◽  
Author(s):  
Salvador Bosch ◽  
Norbert Leinfellner ◽  
Etienne Quesnel ◽  
Angela Duparre ◽  
Josep Ferre-Borrull ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Characterization ◽  
High Quality

Optical Characterization of High Quality ZnTe Substrate

2002 ◽  
Vol 192 (1) ◽  
pp. 218-223 ◽  
Author(s):  
K. Yoshino ◽  
A. Memon ◽  
M. Yoneta ◽  
A. Arakawa ◽  
K. Ohmori ◽  
...  
Keyword(s):  
Optical Characterization ◽  
High Quality
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