scholarly journals Atomic coherence and interference phenomena in resonant nonlinear optical interactions

1996 ◽  
Author(s):  
Alexander K. Popov ◽  
Sergei G. Rautian
Keyword(s):  
Nonlinear Optical ◽  
Atomic Coherence ◽  
Atomic Coherence And Interference

Manipulating atomic coherence and interference in a coupled atom-cavity system

Laser Physics ◽  
2010 ◽  
Vol 20 (5) ◽  
pp. 960-966 ◽  
Author(s):  
J. Zhang ◽  
X. Wei ◽  
G. Hernandez ◽  
Y. Zhu
Keyword(s):  
Atomic Coherence ◽  
Cavity System ◽  
Atomic Coherence And Interference

Atomic coherence and interference in a coupled atom–cavity system

2009 ◽  
Vol 56 (18-19) ◽  
pp. 1955-1963 ◽  
Author(s):  
Jiepeng Zhang ◽  
Gessler Hernandez ◽  
Yifu Zhu
Keyword(s):  
Atomic Coherence ◽  
Cavity System ◽  
Atomic Coherence And Interference

Nonlinear-optical vacuum ultraviolet generation at maximum atomic coherence controlled by a laser-induced Stark chirp of two-photon resonance

2002 ◽  
Vol 209 (4-6) ◽  
pp. 335-347 ◽  
Author(s):  
S.A. Myslivets ◽  
A.K. Popov ◽  
T. Halfmann ◽  
J.P. Marangos ◽  
Thomas F. George
Keyword(s):  
Nonlinear Optical ◽  
Vacuum Ultraviolet ◽  
Atomic Coherence ◽  
Two Photon ◽  
Photon Resonance

Laser Induced Atomic Coherence and Interference in Cold Atoms

2001 ◽  
Vol 48 (3) ◽  
pp. 301-308
Author(s):  
Min Yan ◽  
Edward G. Rickey ◽  
Yifu Zhu
Keyword(s):  
Cold Atoms ◽  
Atomic Coherence ◽  
Atomic Coherence And Interference

Roughness measurements of nonlinear optical polymer films by scanning tunneling microscopy

1989 ◽  
Vol 47 ◽  
pp. 22-23
Author(s):  
I. H. Musselman ◽  
R.-T. Chen ◽  
P. E. Russell
Keyword(s):  
Surface Roughness ◽  
Scanning Tunneling Microscopy ◽  
Nonlinear Optical ◽  
Polymer Surface ◽  
Light Extinction ◽  
Scanning Tunneling ◽  
Silicon Substrates ◽  
Tunneling Microscopy ◽  
Optical Polymer ◽  
Total Light

Scanning tunneling microscopy (STM) has been used to characterize the surface roughness of nonlinear optical (NLO) polymers. A review of STM of polymer surfaces is included in this volume. The NLO polymers are instrumental in the development of electrooptical waveguide devices, the most fundamental of which is the modulator. The most common modulator design is the Mach Zehnder interferometer, in which the input light is split into two legs and then recombined into a common output within the two dimensional waveguide. A π phase retardation, resulting in total light extinction at the output of the interferometer, can be achieved by changing the refractive index of one leg with respect to the other using the electrooptic effect. For best device performance, it is essential that the NLO polymer exhibit minimal surface roughness in order to reduce light scattering. Scanning tunneling microscopy, with its high lateral and vertical resolution, is capable of quantifying the NLO polymer surface roughness induced by processing. Results are presented below in which STM was used to measure the surface roughness of films produced by spin-coating NLO-active polymers onto silicon substrates.

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