Atomic force microscope investigations of topography, lateral force, and electrical properties of metal containing amorphous hydrogenated carbon thin films

1996 ◽  
Author(s):  
Piotr Kazimierski ◽  
Harald Lehmberg
Keyword(s):  
Thin Films ◽  
Electrical Properties ◽  
Atomic Force Microscope ◽  
Lateral Force ◽  
Atomic Force ◽  
Carbon Thin Films ◽  
Amorphous Hydrogenated Carbon

Atomic force microscope study of carbon thin films prepared by pulsed laser deposition

1999 ◽  
Vol 141 (1-2) ◽  
pp. 129-137 ◽  
Author(s):  
Tsuyoshi Yoshitake ◽  
Takashi Nishiyama ◽  
Hajime Aoki ◽  
Koji Suizu ◽  
Koji Takahashi ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscope ◽  
Pulsed Laser Deposition ◽  
Microscope Study ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Atomic Force ◽  
Carbon Thin Films

GROWTH AND ELECTRICAL PROPERTIES OF (Bi, Nd)4Ti3O12 THIN FILMS

2004 ◽  
Vol 11 (06) ◽  
pp. 503-507 ◽  
Author(s):  
CHANGHONG YANG ◽  
ZHUO WANG ◽  
DONGYING PAN ◽  
JIANRU HAN ◽  
QINGXIA LI ◽  
...  
Keyword(s):  
Thin Films ◽  
Dielectric Constant ◽  
Electrical Properties ◽  
Atomic Force Microscope ◽  
Spin Coating ◽  
Annealing Temperature ◽  
X Ray Diffraction ◽  
X Ray ◽  
Atomic Force ◽  
Dissipation Loss

Neodymium-doped Bi 4 Ti 3 O 12 ( Bi 3.15 Nd 0.85 Ti 3 O 12) thin films have been synthesized by metalorganic solution decomposition and deposited on SiO 2/ p - Si (111) substrate by spin coating. The structural characteristic and crystallization of the films were examined by X-ray diffraction and atomic force microscope. The insulating property, dielectric constant and dissipation loss were found to be dependent on the annealing temperature. Nonhysteretic C – V curves at various frequencies were also collected. The films in the ON and OFF states were relatively stable.

The Interaction of CdSe/ZnS Quantum Dot with Plasmonic Ag Nanoparticles Deposited on Amorphous Hydrogenated Carbon Thin Films

2018 ◽  
Vol 125 (5) ◽  
pp. 731-734 ◽  
Author(s):  
D. Khmelevskaya ◽  
D. P. Shcherbinin ◽  
E. A. Konshina ◽  
M. M. Abboud ◽  
A. Dubavik ◽  
...  
Keyword(s):  
Thin Films ◽  
Quantum Dot ◽  
Ag Nanoparticles ◽  
Carbon Thin Films ◽  
Amorphous Hydrogenated Carbon

Friction measurements on phase-separated thin films with a modified atomic force microscope

Nature ◽  
1992 ◽  
Vol 359 (6391) ◽  
pp. 133-135 ◽  
Author(s):  
R. M. Overney ◽  
E. Meyer ◽  
J. Frommer ◽  
D. Brodbeck ◽  
R. Lüthi ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscope ◽  
Atomic Force ◽  
Friction Measurements

Modified Forouhi and Bloomer dispersion model for the optical constants of amorphous hydrogenated carbon thin films

1994 ◽  
Vol 253 (1-2) ◽  
pp. 57-61 ◽  
Author(s):  
William A. McGahan ◽  
Tim Makovicka ◽  
Jeffrey Hale ◽  
John A. Woollam
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Dispersion Model ◽  
Carbon Thin Films ◽  
Amorphous Hydrogenated Carbon
Sign in / Sign up

Export Citation Format

Share Document