Applicability of homogeneous image algebra to electron image processing

1990 ◽  
Author(s):  
Peter W. Hawkes
Keyword(s):  
Image Processing ◽  
Image Algebra ◽  
Electron Image

The 'well-known' theory of electron image formation

1983 ◽  
Vol 41 ◽  
pp. 288-289
Author(s):  
M.A. O'Keefe ◽  
W.O. Saxton
Keyword(s):  
Image Processing ◽  
Image Formation ◽  
Source Profiles ◽  
Electron Image

A recent paper by Kirkland on nonlinear electron image processing, referring to a relatively new textbook, highlights the persistence in the literature of calculations based on incomplete and/or incorrect models of electron imageing, notwithstanding the various papers which have recently pointed out the correct forms of the appropriate equations. Since at least part of the problem can be traced to underlying assumptions about the illumination coherence conditions, we attempt to clarify both the assumptions and the corresponding equations in this paper, illustrating the effects of an incorrect theory by means of images calculated in different ways.The first point to be made clear concerning the illumination coherence conditions is that (except for very thin specimens) it is insufficient simply to know the source profiles present, i.e. the ranges of different directions and energies (focus levels) present in the source; we must also know in general whether the various illumination components are coherent or incoherent with respect to one another.

A new image processing software system for structural analysis and contrast enhancement

1978 ◽  
Vol 36 (1) ◽  
pp. 210-211
Author(s):  
Joachim Frank ◽  
Brian Shimkin
Keyword(s):  
Electron Microscopy ◽  
Image Processing ◽  
Image Data ◽  
Present System ◽  
Software System ◽  
Point Mapping ◽  
Digital Equipment Corp ◽  
Electron Image ◽  
Processing Software ◽  
Image Processing Software

We report on the development of a new image processing software system SPIDER (System for Processing of Image Data in Electron Microscopy and Related Fields). The need for a user-oriented software system for electron image processing has been previously recognized /1-4/. These systems have in common that they allow users with a minimum amount of computer experience to define complex operations on images.The present system runs under the PDP 11/45 RSX-11D (Digital Equipment Corp.) executive in a multi-user, multi-task environment. Image enhancement of large images (e.g., box convolution and point mapping operations) as well as structural electron microscopy (Fourier operations, 3-d reconstruction) had to be accommodated. Characteristic for the electron microscope application is the need to process series of images closely related to each other (defocus, tilting, and averaging series).In SPIDER, the images are read and transferred by magnetic tape from the microdensitometer to PDP 11 disk files.

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