Chromatic aberration corrected switchable optical systems

2018 ◽  
Author(s):  
Nelson V. Tabirian ◽  
Zhi Liao ◽  
Jeoungyeon Hwang ◽  
David Roberts ◽  
Brian Kimball ◽  
...  
Keyword(s):  
Chromatic Aberration ◽  
Optical Systems ◽  
Aberration Corrected

Effect of chromatic aberration on atomic-resolved spherical aberration corrected STEM images

2009 ◽  
Vol 110 (1) ◽  
pp. 36-42 ◽  
Author(s):  
Koji Kuramochi ◽  
Takashi Yamazaki ◽  
Yasutoshi Kotaka ◽  
Masahiro Ohtsuka ◽  
Iwao Hashimoto ◽  
...  
Keyword(s):  
Spherical Aberration ◽  
Chromatic Aberration ◽  
Aberration Corrected Stem ◽  
Aberration Corrected

The imaging properties of electron beams in arbitrary static electromagnetic fields

1952 ◽  
Vol 245 (894) ◽  
pp. 155-187 ◽  
Keyword(s):  
Variational Equation ◽  
Chromatic Aberration ◽  
Relativistic Correction ◽  
Zero Order ◽  
Second Order ◽  
Optical Systems ◽  
Characteristic Functions ◽  
Tensor Calculus ◽  
Paraxial Ray ◽  
Imaging Properties

Electron-optical systems with curved axes—such as mass spectrographs and certain beta-ray spectrometers—have long been in practical use, but there has been available no complete theory of the aberrations of such systems. It is the object of the present paper to construct such a theory and to demonstrate, by an example, its application to practical problems. An appropriate co-ordinate system is set up by means of a ray-axis together with its normal and binormal. The electric and magnetic fields are then investigated with the help of tensor calculus; the variational principle of electron optics is also put into tensor form. The integrand of the variational equation may be separated into a series of polynomials, one of which determines the paraxial imaging properties of the system and the rest of which determine the aberrations. The condition is established for which, upon an appropriate transformation, either of the paraxial ray equations contains only one off-axis co-ordinate. Subsequent investigations are restricted to systems, which are termed ‘orthogonal’, for which this condition is satisfied. It is shown that, in a certain sense, no orthogonal electron-optical system can be wholly divergent. The second-order aberration and the zero-order and paraxial chromatic aberrations are then investigated by the method of perturbation characteristic functions. All formulae are given in their relativistic forms but their non-relativistic forms are indicated; formulae are therefore given for the calculation of the zero-order and paraxial relativistic correction. It is indicated to what extent one forfeits control over the second-order aberration—and hence over the paraxial chromatic aberration also—by specifying that the paraxial behaviour of rays should be Gaussian. As an example, the imaging properties of a helical beam moving in the field of a pair of coaxial cylindrical electrodes are calculated. There is also an appendix which gives formulae for the effect upon aberrations of a change in the aperture position.

Chromatic aberration of plane-symmetric optical systems: publisher’s note

2019 ◽  
Vol 58 (10) ◽  
pp. 2556
Author(s):  
Yiqing Cao ◽  
Lijun Lu ◽  
Zhiyong Deng
Keyword(s):  
Chromatic Aberration ◽  
Optical Systems ◽  
Plane Symmetric

Chromatic aberration of plane-symmetric optical systems

2019 ◽  
Vol 58 (2) ◽  
pp. 227 ◽  
Author(s):  
Yiqing Cao ◽  
Lijun Lu ◽  
Zhiyong Deng
Keyword(s):  
Chromatic Aberration ◽  
Optical Systems ◽  
Plane Symmetric

scholarly journals Opportunities for Chromatic Aberration Corrected High-Resolution Transmission Electron Microscopy, Lorentz Microscopy and Electron Holography of Magnetic Minerals

2012 ◽  
Vol 18 (S2) ◽  
pp. 1708-1709 ◽  
Author(s):  
R. Dunin-Borkowski ◽  
L. Houben ◽  
J. Barthel ◽  
A. Thust ◽  
M. Luysberg ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Chromatic Aberration ◽  
Electron Holography ◽  
Magnetic Minerals ◽  
Lorentz Microscopy ◽  
Transmission Electron ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

The Principles Of Aberration-Corrected Optical Systems

1986 ◽  
Author(s):  
Richard G. Bingham ◽  
Michael J. Kidger
Keyword(s):  
Optical Systems ◽  
Aberration Corrected

Impact of Polarization Chromatic Aberration on Adaptive Optical Systems

2020 ◽  
Vol 57 (15) ◽  
pp. 150101
Author(s):  
徐百威 Xu Baiwei ◽  
胡诗杰 Hu Shijie ◽  
李杰 Li Jie ◽  
樊俊琪 Fan Junqi ◽  
谭毅 Tan Yi
Keyword(s):  
Chromatic Aberration ◽  
Optical Systems
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