VERITAS 2.2: a low noise source follower and drain current readout integrated circuit for the wide field imager on the Athena x-ray satellite

2018 ◽  
Author(s):  
Sven Herrmann ◽  
Anna Koch ◽  
Sara Obergassel ◽  
Wolfgang Treberspurg ◽  
Michael Bonholzer ◽  
...  
Keyword(s):  
Integrated Circuit ◽  
Noise Source ◽  
Drain Current ◽  
Low Noise ◽  
Wide Field ◽  
Readout Integrated Circuit ◽  
X Ray ◽  
Source Follower

High-performance low-noise 128-channel readout-integrated circuit for flat-panel x-ray detector systems

2004 ◽  
Author(s):  
Eric J. Beuville ◽  
Mark Belding ◽  
Adrienne N. Costello ◽  
Randy Hansen ◽  
Susan M. Petronio
Keyword(s):  
Integrated Circuit ◽  
High Performance ◽  
Low Noise ◽  
Flat Panel ◽  
Readout Integrated Circuit ◽  
X Ray

Pixel readout IC for CdTe detectors operating in single photon counting mode with interpixel communication

2022 ◽  
Vol 17 (01) ◽  
pp. C01036
Author(s):  
P. Grybos ◽  
R. Kleczek ◽  
P. Kmon ◽  
A. Krzyzanowska ◽  
P. Otfinowski ◽  
...  
Keyword(s):  
Integrated Circuit ◽  
Single Photon ◽  
Photon Counting ◽  
Recognition Algorithm ◽  
Total Charge ◽  
Readout Integrated Circuit ◽  
Single Photon Counting ◽  
X Ray ◽  
Pixel Detectors ◽  
Photon Counting Mode

Abstract This paper presents a readout integrated circuit (IC) of pixel architecture called MPIX (Multithreshold PIXels), designed for CdTe pixel detectors used in X-ray imaging applications. The MPIX IC area is 9.6 mm × 20.3 mm and it is designed in a CMOS 130 nm process. The IC core is a matrix of 96 × 192 square-shaped pixels of 100 µm pitch. Each pixel contains a fast analog front-end followed by four independently working discriminators and four 12-bit ripple counters. Such pixel architecture allows photon processing one by one and selecting the X-ray photons according to their energy (X-ray colour imaging). To fit the different range of applications the MPIX IC has 8 possible different gain settings, and it can process the X-ray photons of energy up to 154 keV. The MPIX chip is bump-bonded to the CdTe 1.5 mm thick pixel sensor with a pixel pitch of 100 µm. To deal with the charge sharing effect coming from a thick semiconductor pixel sensor, multithreshold pattern recognition algorithm is implemented in the readout IC. The implemented algorithm operates both in the analog domain (to recover the total charge spread between neighboring pixels, when a single X-ray photon hits the border of the pixel) and in the digital domain (to allocate a hit position to a single pixel).

scholarly journals A 24.88 nV/√Hz Wheatstone Bridge Readout Integrated Circuit with Chopper-Stabilized Multipath Operational Amplifier

2020 ◽  
Vol 10 (1) ◽  
pp. 399 ◽  
Author(s):  
Kwonsang Han ◽  
Hyungseup Kim ◽  
Jaesung Kim ◽  
Donggeun You ◽  
Hyunwoo Heo ◽  
...  
Keyword(s):  
Integrated Circuit ◽  
Operational Amplifier ◽  
Wheatstone Bridge ◽  
Input Resistance ◽  
Cmos Technology ◽  
Low Noise ◽  
Oxide Semiconductor ◽  
Instrumentation Amplifier ◽  
Readout Integrated Circuit ◽  
Chopper Stabilization

This paper proposes a low noise readout integrated circuit (IC) with a chopper-stabilized multipath operational amplifier suitable for a Wheatstone bridge sensor. The input voltage of the readout IC changes due to a change in input resistance, and is efficiently amplified using a three-operational amplifier instrumentation amplifier (IA) structure with high input impedance and adjustable gain. Furthermore, a chopper-stabilized multipath structure is applied to the operational amplifier, and a ripple reduction loop (RRL) in the low frequency path (LFP) is employed to attenuate the ripple generated by the chopper stabilization technique. A 12-bit successive approximation register (SAR) analog-to-digital converter (ADC) is employed to convert the output voltage of the three-operational amplifier IA into digital code. The Wheatstone bridge readout IC is manufactured using a standard 0.18 µm complementary metal-oxide-semiconductor (CMOS) technology, drawing 833 µA current from a 1.8 V supply. The input range and the input referred noise are ±20 mV and 24.88 nV/√Hz, respectively.

The Low Energy X-ray Spectrometry Technique as Applied to Semiconductors

2006 ◽  
Vol 12 (4) ◽  
pp. 340-346 ◽  
Author(s):  
Pierre-François Staub
Keyword(s):  
Integrated Circuit ◽  
Analytical Method ◽  
Low Energy ◽  
Fabrication Process ◽  
Emission Spectrometry ◽  
Wide Field ◽  
X Ray ◽  
Potential Applications ◽  
Spectrometry Technique ◽  
Integrated Circuit Industry

We describe the recent introduction of low energy X-ray emission spectrometry as a metrology technique to control the fabrication process in the integrated circuit industry. The benefits of this particular analytical method and the wide field of potential applications are addressed.

A low noise readout integrated circuit for Nb5N6 microbolometer array detector

2017 ◽  
Author(s):  
Zhou Jiang ◽  
Chao Wan ◽  
Peng Xiao ◽  
Chengtao Jiang ◽  
Xuecou Tu ◽  
...  
Keyword(s):  
Integrated Circuit ◽  
Low Noise ◽  
Array Detector ◽  
Readout Integrated Circuit

A LOW POWER HIGH RESOLUTION ROIC DESIGN WITH 14-BIT COLUMN-LEVEL ADC FOR 384 × 288 IRFPA

2013 ◽  
Vol 22 (09) ◽  
pp. 1340015 ◽  
Author(s):  
YAJING ZHANG ◽  
WENGAO LU ◽  
GUANNAN WANG ◽  
ZHONGJIAN CHEN ◽  
YACONG ZHANG
Keyword(s):  
High Resolution ◽  
Low Power ◽  
Integrated Circuit ◽  
High Speed ◽  
High Performance ◽  
Low Noise ◽  
Cmos Process ◽  
Readout Integrated Circuit ◽  
Analog To Digital Conversion ◽  
Amplifier Design

A readout integrated circuit (ROIC) of infrared focal plane array (IRFPA) with low power and low noise is presented in this paper. It consists of a 384 × 288 pixel array and column-level A/D conversion circuits. The proposed system has high resolution because of the odd–even Analog to Digital Conversion (ADC) structure, containing correlated switches design, multi-Vth amplifier design and high speed high resolution comparator design including latch-stage. Designed and simulated in 0.35-μm CMOS process, this high performance ROIC achieves 81.24 dB SNR at 8.64 KS/s consuming 98 mW under 5 V voltage supply, resulting in an ENOB of 13.2-bit.

Model-Based Low-Noise Readout Integrated Circuit Design for Uncooled Microbolometers

2013 ◽  
Vol 13 (4) ◽  
pp. 1207-1215 ◽  
Author(s):  
Jian Lv ◽  
Hui Zhong ◽  
Yun Zhou ◽  
BaoBin Liao ◽  
Jun Wang ◽  
...  
Keyword(s):  
Circuit Design ◽  
Integrated Circuit ◽  
Low Noise ◽  
Integrated Circuit Design ◽  
Readout Integrated Circuit ◽  
Model Based

Test of 32-Channel X-Ray Readout Integrated Circuit

2013 ◽  
Vol 718-720 ◽  
pp. 1100-1103
Author(s):  
Liu Dan ◽  
Gao Feng ◽  
Jin Chuan
Keyword(s):  
Cross Talk ◽  
Integrated Circuit ◽  
Dynamic Range ◽  
Laser Light ◽  
High Accuracy ◽  
Test Method ◽  
Voltage Source ◽  
Readout Integrated Circuit ◽  
X Ray

The test method of 32 channel X-ray readout integrated circuit (ROIC) has been proposed in this paper. Large resistors and a voltage source with high accuracy are used to generate 32 channels of weak currents, which are injected into the ROIC. Some key parameters of ROIC such as linearity, uniformity, cross talk, dynamic range have been tested. This method helps to test ROICs performance and does not need any photodiode and any laser light, which is convenient and easy to be realized.

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