Near-field infrasound classification of rocket launch signatures

2018 ◽  
Author(s):  
Kaleb Smith ◽  
Mitchell Solomon ◽  
Kaylen J. Bryan ◽  
Anthony O. Smith ◽  
Adrian M. Peter
Keyword(s):  
Near Field ◽  
Rocket Launch

scholarly journals Answers to Fundamental Questions in Superresolution Microscopy

2021 ◽  
Author(s):  
Rainer Heintzmann
Keyword(s):  
Light Microscopy ◽  
Prior Knowledge ◽  
Near Field ◽  
Structured Illumination ◽  
Resolution Limit ◽  
Structured Illumination Microscopy ◽  
Technical Aspects ◽  
Superresolution Microscopy ◽  
Definition Of

This article presents answers to the questions on superresolution and structured illumination microscopy as raised in the editorial of a recent publication [K. Prakash et al. arXiv, 2102.13649, 2021]. The answers are based on my personal views on superresolution in light microscopy, supported by reasoning. Discussed are the definition of superresolution, Abbe’s resolution limit and the classification of superresolution methods into non-linear-, prior-knowledge- and near-field-based superresolution. A further focus is put on capabilities and technical aspects of present and future structured illumination microscopy (SIM) methods.

scholarly journals Image-Based Inspection Technique of a Machined Metal Surface for an Unmanned Lapping Process

2019 ◽  
Vol 7 (3) ◽  
pp. 547-557 ◽  
Author(s):  
Dinuka Ravimal ◽  
Hanul Kim ◽  
Daegwon Koh ◽  
Jin Hyuk Hong ◽  
Sun-Kyu Lee
Keyword(s):  
Near Field ◽  
Surface Inspection ◽  
Skilled Workers ◽  
Machined Surface ◽  
Tool Marks ◽  
Industrial Sites ◽  
Reflected Light ◽  
Milling Tool ◽  
Contrast Image

AbstractThis paper presents a new machine vision framework for the efficient examination and classification of surface textures on medium- and large-sized mold products, such as used for automobiles, TVs, and refrigerators. Existing techniques, which are based on the hands and eyes of skilled workers, are inconsistent and time-consuming. Although there are many types of precise surface inspection and measurement methods, most are difficult to apply at industrial sites or by finishing robots due to problems such as speed, setup limitations, and robustness. This paper proposes two techniques based on image processing that aims to automate surface inspection during an unmanned lapping process that is mainly employed to eliminate milling tool marks. First, both the shape of the reflected light and the intensity of the captured near-field contrast image right after the reflected specular are used to determine the machined surface state, and the presence of tool marks as the line light source scans counter-clockwise. Second, the photometric stereo technique is used to detect surface scratches through the normal map that recovers the surface. The proposed techniques show localized machined patterns and classify them with high accuracy.

scholarly journals Application of UWB Near-Field Polarimetry to Classification of GPR Targets

2007 ◽  
pp. 655-664 ◽  
Author(s):  
Alexander Yarovoy ◽  
Friedrich Roth ◽  
Vsevolod Kovalenko ◽  
Leo Ligthart
Keyword(s):  
Near Field

Passive localization and classification of mixed near-field and far-field sources based on high-order differencing algorithm

2019 ◽  
Vol 157 ◽  
pp. 119-130 ◽  
Author(s):  
Amir Masoud Molaei ◽  
Bijan Zakeri ◽  
Seyed Mehdi Hosseini Andargoli
Keyword(s):  
Near Field ◽  
High Order ◽  
Far Field ◽  
Passive Localization

scholarly journals Answers to fundamental questions in superresolution microscopy

2021 ◽  
Vol 379 (2199) ◽  
Author(s):  
Rainer Heintzmann
Keyword(s):  
Light Microscopy ◽  
Near Field ◽  
Super Resolution ◽  
Structured Illumination ◽  
Resolution Limit ◽  
Structured Illumination Microscopy ◽  
Technical Aspects ◽  
Superresolution Microscopy ◽  
Definition Of

This article presents answers to the questions on superresolution and structured illumination microscopy (SIM) as raised in the editorial of this collection of articles ( https://doi.org/10.1098/rsta.2020.0143 ). These answers are based on my personal views on superresolution in light microscopy, supported by reasoning. Discussed are the definition of superresolution, Abbe's resolution limit and the classification of superresolution methods into nonlinear-, prior knowledge- and near-field-based superresolution. A further focus is put on the capabilities and technical aspects of present and future SIM methods. This article is part of the Theo Murphy meeting issue ‘Super-resolution structured illumination microscopy (part 1)’.

Statistical classification of road pavements using near field vehicle rolling noise measurements

2010 ◽  
Vol 128 (4) ◽  
pp. 1747-1754 ◽  
Author(s):  
Joel Preto Paulo ◽  
J. L. Bento Coelho ◽  
Mário A. T. Figueiredo
Keyword(s):  
Near Field ◽  
Statistical Classification ◽  
Noise Measurements ◽  
Rolling Noise

Note on the spectral classification of carbon stars in the photographic infrared region

1966 ◽  
Vol 24 ◽  
pp. 21-23
Author(s):  
Y. Fujita
Keyword(s):  
Infrared Region ◽  
Spectral Classification ◽  
Carbon Stars

We have investigated the spectrograms (dispersion: 8Å/mm) in the photographic infrared region fromλ7500 toλ9000 of some carbon stars obtained by the coudé spectrograph of the 74-inch reflector attached to the Okayama Astrophysical Observatory. The names of the stars investigated are listed in Table 1.

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