Beam shaping and in-situ diagnostics for development of transparent materials processing

2018 ◽  
Author(s):  
Malte Kumkar ◽  
Felix Zimmermann ◽  
Jonas Kleiner ◽  
Daniel Flamm ◽  
Michael Jenne ◽  
...  
Keyword(s):  
Beam Shaping ◽  
Materials Processing ◽  
Transparent Materials ◽  
In Situ Diagnostics

scholarly journals Ultrafast laser processing of transparent materials supported by in-situ diagnostics

2021 ◽  
Author(s):  
Malte Kumkar ◽  
Myriam Kaiser ◽  
Jonas Kleiner ◽  
Daniel Günther Grossmann ◽  
Daniel Flamm ◽  
...  
Keyword(s):  
Laser Processing ◽  
Bulk Material ◽  
Ultrafast Laser ◽  
Rear Side ◽  
Laser Etching ◽  
Pump Probe ◽  
Transient Stress ◽  
Transparent Materials ◽  
In Situ Diagnostics

For the development of industrial NIR ultrafast laser processing of transparent materials, the absorption inside the bulk material has to be controlled. Applications we aim for are front and rear side ablation, drilling and inscription of modifications for cleaving and selective laser etching of glass and sapphire in sheet geometry. We applied pump probe technology and in situ stress birefringence microscopy for fundamental studies on the influence of energy and duration (100 fs – 20 ps), temporal and spatial spacing, focusing and beam shaping of the laser pulses. Applying pump probe technique we are able to visualize differences of spatio-temporal build up of absorption, self focusing, shock wave generation for standard, multispot and beam shaped focusing. Incubation effects and disturbance of beam propagation due to modifications or ablation can be observed. In-situ imaging of stress birefringence gained insight in transient build up of stress with and without translation. The results achieved so far, demonstrate that transient stress has to be taken into account in scaling the laser machining throughput of brittle materials. Furthermore it points out that transient stress birefringence is a good indicator for accumulation effects, supporting tailored processing strategies.Cutting results achieved for selective laser etching by single pass laser modification exemplifies the benefits of process development supported by in situ diagnostics.

scholarly journals Throughput scaling by spatial beam shaping and dynamic focusing

2021 ◽  
Author(s):  
Malte Kumkar ◽  
Myriam Kaiser ◽  
Jonas Kleiner ◽  
Daniel Flamm ◽  
Daniel Günther Grossmann ◽  
...  
Keyword(s):  
High Power ◽  
Ultrafast Lasers ◽  
Process Development ◽  
Short Pulse ◽  
Processing Parameters ◽  
In Situ Stress ◽  
Beam Shaping ◽  
Heat Accumulation ◽  
Transparent Materials

With availability of high power ultra short pulsed lasers, one prerequisite towards throughput scaling demanded for industrial ultrafast laser processing was recently achieved. We will present different scaling approaches for ultrafast machining, including raster and vector based concepts. The main attention is on beam shaping for enlarged, tailored processed volume per pulse. Some aspects on vector based machining using beam shaping are discussed. With engraving of steel and full thickness modification of transparent materials, two different approaches for throughput scaling by confined interaction volume, avoiding detrimental heat accumulation, are exemplified. In Contrast, welding of transparent materials based on nonlinear absorption benefits from ultra short pulse processing in heat accumulation regime. Results on in-situ stress birefringence microscopy demonstrate the complex interplay of processing parameters on heat accumulation. With respect to process development, the potential of in-in-situ diagnostics, extended to high power ultrafast lasers and diagnostics allowing for multi-scale resolution in space and time is addressed.

scholarly journals Ultrafast laser processing of transparent materials supported by in-situ diagnostics

2016 ◽  
Author(s):  
M. Kumkar ◽  
M. Kaiser ◽  
J. Kleiner ◽  
D. Grossmann ◽  
D. Flamm ◽  
...  
Keyword(s):  
Laser Processing ◽  
Ultrafast Laser ◽  
Transparent Materials ◽  
In Situ Diagnostics

Concepts for In Situ Diagnostics in Analog Microelectronic Circuits

2007 ◽  
Author(s):  
Ted Kolasa ◽  
Alfredo Mendoza
Keyword(s):  
Analog Circuits ◽  
System Architecture ◽  
Analog Circuit ◽  
Fault Localization ◽  
Diagnostic System ◽  
Diagnostic Capability ◽  
Common Signal ◽  
Diagnostic Capabilities ◽  
In Situ Diagnostics

Abstract Comprehensive in situ (designed-in) diagnostic capabilities have been incorporated into digital microelectronic systems for years, yet similar capabilities are not commonly incorporated into the design of analog microelectronics. And as feature sizes shrink and back end interconnect metallization becomes more complex, the need for effective diagnostics for analog circuits becomes ever more critical. This paper presents concepts for incorporating in situ diagnostic capability into analog circuit designs. Aspects of analog diagnostic system architecture are discussed as well as nodal measurement scenarios for common signal types. As microelectronic feature sizes continue to shrink, diagnostic capabilities such as those presented here will become essential to the process of fault localization in analog circuits.

Systems of In Situ Diagnostics of Plasma-Surface Interaction in a Mephist-1 Tokamak

2021 ◽  
Author(s):  
V. A. Kurnaev ◽  
V. E. Nikolaeva ◽  
S. A. Krat ◽  
E. D. Vovchenko ◽  
A. V. Kaziev ◽  
...  
Keyword(s):  
Surface Interaction ◽  
Plasma Surface ◽  
In Situ Diagnostics

In-situ Diagnostics of Composite Filament Material Suitable for Bi-Polar Plate Using Additive Manufacturing

2021 ◽  
Vol 104 (8) ◽  
pp. 283-292
Author(s):  
David Alexander ◽  
Jake Pellicotte ◽  
Alejandro Mejia ◽  
Caitlin Benway ◽  
Calvin Maurice Stewart ◽  
...  
Keyword(s):  
Additive Manufacturing ◽  
Composite Filament ◽  
In Situ Diagnostics

An upgraded LIBS system on linear plasma device PSI-2 for in situ diagnostics of plasma-facing materials

2019 ◽  
Vol 146 ◽  
pp. 96-99 ◽  
Author(s):  
X. Jiang ◽  
G. Sergienko ◽  
B. Schweer ◽  
S. Möller ◽  
M. Freisinger ◽  
...  
Keyword(s):  
Plasma Device ◽  
Plasma Facing Materials ◽  
Linear Plasma ◽  
In Situ Diagnostics

scholarly journals In Situ Diagnostics of Damage Accumulation in Ni-Based Superalloys Using High-Temperature Computed Tomography

2018 ◽  
Vol 49 (9) ◽  
pp. 4274-4289 ◽  
Author(s):  
K. Kageyama ◽  
F. Adziman ◽  
E. Alabort ◽  
T. Sui ◽  
A. M. Korsunsky ◽  
...  
Keyword(s):  
Computed Tomography ◽  
High Temperature ◽  
Damage Accumulation ◽  
In Situ Diagnostics
Sign in / Sign up

Export Citation Format

Share Document