High-image quality, high-resolution camera with high sensitivity up to 1,100 nm

2018 ◽  
Author(s):  
Shuya Satoh ◽  
Takeshi Koyama ◽  
Hiroyuki Ishihara ◽  
Teruo Hieda ◽  
Kazuhiko Kawase ◽  
...  
Keyword(s):  
High Resolution ◽  
Image Quality ◽  
High Sensitivity ◽  
High Image Quality

A luminance adjusting algorithm for high resolution and high image quality AMOLED displays of mobile phone applications

2010 ◽  
Vol 56 (3) ◽  
pp. 1191-1195 ◽  
Author(s):  
Hai-Jung In ◽  
Kyong-Hwan Oh ◽  
Oh-Kyong Kwon ◽  
Chang Hyun ◽  
Sung-Chul Kim
Keyword(s):  
High Resolution ◽  
Image Quality ◽  
Mobile Phone ◽  
High Image Quality ◽  
Mobile Phone Applications

76‐2: Distinguished Paper: A High‐Image‐Quality OLED Display with Motion Blur Reduction for Ultra‐High Resolution and Premium TVs

2020 ◽  
Vol 51 (1) ◽  
pp. 1131-1134
Author(s):  
Hong-Jae Shin ◽  
Soo-Hong Choi ◽  
Sung-Joong Kim ◽  
Jae-Kyu Park ◽  
Seong-Ho Yun ◽  
...  
Keyword(s):  
High Resolution ◽  
Image Quality ◽  
Motion Blur ◽  
High Image Quality ◽  
Oled Display

Progress In The Practical Application Of Automated Image Analysis To Tem Negatives

1977 ◽  
Vol 35 ◽  
pp. 214-217
Author(s):  
F. A. Heckman ◽  
E. Redman ◽  
J.E. Connolly
Keyword(s):  
Image Analysis ◽  
Image Quality ◽  
Exposure Time ◽  
Image Contrast ◽  
Automated Image Analysis ◽  
Practical Application ◽  
Factors Affecting ◽  
High Image Quality ◽  
Qualitative Evidence ◽  
Comprehensive Study

In our initial publication on this subject1) we reported results demonstrating that contrast is the most important factor in producing the high image quality required for reliable image analysis. We also listed the factors which enhance contrast in order of the experimentally determined magnitude of their effect. The two most powerful factors affecting image contrast attainable with sheet film are beam intensity and KV. At that time we had only qualitative evidence for the ranking of enhancing factors. Later we carried out the densitometric measurements which led to the results outlined below.Meaningful evaluations of the cause-effect relationships among the considerable number of variables in preparing EM negatives depend on doing things in a systematic way, varying only one parameter at a time. Unless otherwise noted, we adhered to the following procedure evolved during our comprehensive study:Philips EM-300; 30μ objective aperature; magnification 7000- 12000X, exposure time 1 second, anti-contamination device operating.

Backscattered Electron Imaging of GaAs/AlGaAs Super Lattice Structures with an Ultra-High- Resolution SEM

1988 ◽  
Vol 46 ◽  
pp. 204-205
Author(s):  
Kazumichi Ogura ◽  
Michael M. Kersker
Keyword(s):  
High Resolution ◽  
Layer Structure ◽  
High Sensitivity ◽  
Beam Current ◽  
Electron Beam Current ◽  
Lattice Structures ◽  
Super Lattice ◽  
Different Types ◽  
Backscattered Electron ◽  
Electron Imaging

Backscattered electron (BE) images of GaAs/AlGaAs super lattice structures were observed with an ultra high resolution (UHR) SEM JSM-890 with an ultra high sensitivity BE detector. Three different types of super lattice structures of GaAs/AlGaAs were examined. Each GaAs/AlGaAs wafer was cleaved by a razor after it was heated for approximately 1 minute and its crosssectional plane was observed.First, a multi-layer structure of GaAs (100nm)/AlGaAs (lOOnm) where A1 content was successively changed from 0.4 to 0.03 was observed. Figures 1 (a) and (b) are BE images taken at an accelerating voltage of 15kV with an electron beam current of 20pA. Figure 1 (c) is a sketch of this multi-layer structure corresponding to the BE images. The various layers are clearly observed. The differences in A1 content between A1 0.35 Ga 0.65 As, A1 0.4 Ga 0.6 As, and A1 0.31 Ga 0.69 As were clearly observed in the contrast of the BE image.

VIS-NIR LED Illumination in Backside Circuit Edit and Optical Probing Applications

2012 ◽  
Author(s):  
Shida Tan ◽  
Richard H. Livengood ◽  
Dane Scott ◽  
Roy Hallstein ◽  
Pat Pardy ◽  
...  
Keyword(s):  
High Resolution ◽  
Image Quality ◽  
Optical Imaging ◽  
Narrow Band ◽  
Light Emitting Diode ◽  
Air Gap ◽  
Optical Image ◽  
Proof Of Concept ◽  
Light Emitting ◽  
Optical Probing

Abstract High resolution optical imaging is critical in assisting backside circuit edit (CE) and optical probing navigation. In this paper, we demonstrated improved optical image quality using VIS-NIR narrow band light emitting diode (LED) illumination in various FIB and optical probing platforms. The proof of concept was demonstrated with both common non-contact air gap lenses and solid immersion lenses (SIL).

scholarly journals Photogrammetric Digital Surface Model Reconstruction in Extreme Low-Light Environments

2021 ◽  
Vol 13 (7) ◽  
pp. 1261
Author(s):  
Riccardo Roncella ◽  
Nazarena Bruno ◽  
Fabrizio Diotri ◽  
Klaus Thoeni ◽  
Anna Giacomini
Keyword(s):  
Image Quality ◽  
Image Quality Assessment ◽  
High Sensitivity ◽  
Sensor Technology ◽  
Surface Model ◽  
Night Time ◽  
Low Light ◽  
Reduction Techniques ◽  
Geometrical Information ◽  
Imaging Sensors

Digital surface models (DSM) have become one of the main sources of geometrical information for a broad range of applications. Image-based systems typically rely on passive sensors which can represent a strong limitation in several survey activities (e.g., night-time monitoring, underground survey and night surveillance). However, recent progresses in sensor technology allow very high sensitivity which drastically improves low-light image quality by applying innovative noise reduction techniques. This work focuses on the performances of night-time photogrammetric systems devoted to the monitoring of rock slopes. The study investigates the application of different camera settings and their reliability to produce accurate DSM. A total of 672 stereo-pairs acquired with high-sensitivity cameras (Nikon D800 and D810) at three different testing sites were considered. The dataset includes different camera configurations (ISO speed, shutter speed, aperture and image under-/over-exposure). The use of image quality assessment (IQA) methods to evaluate the quality of the images prior to the 3D reconstruction is investigated. The results show that modern high-sensitivity cameras allow the reconstruction of accurate DSM in an extreme low-light environment and, exploiting the correct camera setup, achieving comparable results to daylight acquisitions. This makes imaging sensors extremely versatile for monitoring applications at generally low costs.

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