Comparison of direct-conversion a-Se and CsI scintillator-based CMOS FFDM/DBT flat-panel detectors using an anthropomorphic breast phantom with embedded microcalcification signals

2018 ◽  
Author(s):  
Andrey V. Makeev ◽  
Lynda C. Ikejimba ◽  
Stephen J. Glick
Keyword(s):  
Direct Conversion ◽  
Flat Panel ◽  
Breast Phantom ◽  
Flat Panel Detectors

Ghosting caused by bulk charge trapping in direct conversion flat-panel detectors using amorphous selenium

2005 ◽  
Vol 32 (2) ◽  
pp. 488-500 ◽  
Author(s):  
Wei Zhao ◽  
G. DeCrescenzo ◽  
Safa O. Kasap ◽  
J. A. Rowlands
Keyword(s):  
Charge Trapping ◽  
Direct Conversion ◽  
Amorphous Selenium ◽  
Flat Panel ◽  
Flat Panel Detectors ◽  
Bulk Charge

Development of quality control system for flat-panel detectors

2011 ◽  
Vol 4 (2) ◽  
pp. 164-172 ◽  
Author(s):  
Atsushi Teramoto ◽  
Takahiko Kajihara ◽  
Shoichi Suzuki ◽  
Kazuo Kinoshita ◽  
Masatoshi Tsuzaka ◽  
...  
Keyword(s):  
Quality Control ◽  
Control System ◽  
Quality Control System ◽  
Flat Panel ◽  
Flat Panel Detectors

Direct-conversion flat-panel X-ray image detectors

2002 ◽  
Vol 149 (2) ◽  
pp. 85-96 ◽  
Author(s):  
S.O. Kasap ◽  
J.A. Rowlands
Keyword(s):  
Direct Conversion ◽  
Flat Panel ◽  
X Ray

Market Overview of Flat Panel Detectors for X-Ray Imaging

2010 ◽  
pp. 497-509
Author(s):  
Carl Lacasce ◽  
Larry Partain ◽  
Chuck Blouir
Keyword(s):  
Flat Panel ◽  
X Ray ◽  
X Ray Imaging ◽  
Flat Panel Detectors

Scintillating glass‐ceramic substrates for indirect flat panel detectors in digital radiography

2020 ◽  
Vol 103 (12) ◽  
pp. 6893-6900
Author(s):  
Russell L. Leonard ◽  
Danielle T. Berkowitz ◽  
Austin Thomas ◽  
Adrian Howansky ◽  
Anthony R. Lubinsky ◽  
...  
Keyword(s):  
Digital Radiography ◽  
Glass Ceramic ◽  
Flat Panel ◽  
Ceramic Substrates ◽  
Flat Panel Detectors

scholarly journals Gain and offset calibration reduces variation in exposure-dependent SNR among systems with identical digital flat-panel detectors

2011 ◽  
Vol 38 (7) ◽  
pp. 4422-4429 ◽  
Author(s):  
Charles E. Willis ◽  
Yevgeniy Y. Vinogradskiy ◽  
Brad K. Lofton ◽  
R. Allen White
Keyword(s):  
Flat Panel ◽  
Flat Panel Detectors

Measurement of the electrical properties of a polycrystalline cadmium telluride for direct conversion flat panel x-ray detector

2014 ◽  
Vol 9 (01) ◽  
pp. P01010-P01010 ◽  
Author(s):  
K M Oh ◽  
D K kim ◽  
J W Shin ◽  
S U Heo ◽  
J S Kim ◽  
...  
Keyword(s):  
Electrical Properties ◽  
Cadmium Telluride ◽  
Direct Conversion ◽  
Flat Panel ◽  
X Ray
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