A method based on analytical expression to study echo laser pulse

2017 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments ◽

10.1117/12.2292727 ◽

2018 ◽

Author(s):

Qiang Luo ◽

Jianguo Cui ◽

Hongpeng Lv ◽

Weiping Sun ◽

Chao Liang

Keyword(s):

Laser Pulse ◽

Analytical Expression

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On the influence of specimen thickness in TEM images of super-conducting vortices

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100166087 ◽

1996 ◽

Vol 54 ◽

pp. 724-725

Author(s):

J. Bonevich ◽

D. Capacci ◽

G. Pozzi ◽

K. Harada ◽

H. Kasai ◽

...

Keyword(s):

Flux Line ◽

Analytical Form ◽

Realistic Model ◽

Electron Holography ◽

Specimen Thickness ◽

Flux Tubes ◽

Analytical Expression ◽

Flux Lines ◽

Normal Core ◽

Two Parameters

The successful observation of superconducting flux lines (fluxons) in thin specimens both in conventional and high Tc superconductors by means of Lorentz and electron holography methods has presented several problems concerning the interpretation of the experimental results. The first approach has been to model the fluxon as a bundle of flux tubes perpendicular to the specimen surface (for which the electron optical phase shift has been found in analytical form) with a magnetic flux distribution given by the London model, which corresponds to a flux line having an infinitely small normal core. In addition to being described by an analytical expression, this model has the advantage that a single parameter, the London penetration depth, completely characterizes the superconducting fluxon. The obtained results have shown that the most relevant features of the experimental data are well interpreted by this model. However, Clem has proposed another more realistic model for the fluxon core that removes the unphysical limitation of the infinitely small normal core and has the advantage of being described by an analytical expression depending on two parameters (the coherence length and the London depth).

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Contrast From Point Defects in The Infinitesimal Approximation

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s1431927600001495 ◽

1980 ◽

Vol 38 ◽

pp. 350-351

Author(s):

L. J. Sykes ◽

J. J. Hren

Keyword(s):

Electron Microscope ◽

Point Defects ◽

Broad Class ◽

Stacking Fault ◽

Crystalline Solids ◽

Dislocation Loops ◽

Analytical Expression ◽

Stacking Fault Tetrahedra

In electron microscope studies of crystalline solids there is a broad class of very small objects which are imaged primarily by strain contrast. Typical examples include: dislocation loops, precipitates, stacking fault tetrahedra and voids. Such objects are very difficult to identify and measure because of the sensitivity of their image to a host of variables and a similarity in their images. A number of attempts have been made to publish contrast rules to help the microscopist sort out certain subclasses of such defects. For example, Ashby and Brown (1963) described semi-quantitative rules to understand small precipitates. Eyre et al. (1979) published a catalog of images for BCC dislocation loops. Katerbau (1976) described an analytical expression to help understand contrast from small defects. There are other publications as well.

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