scholarly journals Attenuation measurements in single-crystal sapphire fiber via Raman scattering intensity

Author(s):  
Bo Liu ◽  
Michael P. Buric ◽  
Zhihao Yu ◽  
Daniel Homa ◽  
Cary Hill ◽  
...  
2012 ◽  
Author(s):  
Tongqing Liu ◽  
Ming Han ◽  
Cody Raml ◽  
Dennis R. Alexander ◽  
Xiangnan He ◽  
...  

1995 ◽  
Vol 14 (1) ◽  
pp. 31-38 ◽  
Author(s):  
Haydn N. G. Wadley ◽  
Yichi Lu ◽  
Jeffrey A. Goldman

2017 ◽  
Vol 56 (31) ◽  
pp. 8598 ◽  
Author(s):  
Juddha Thapa ◽  
Bo Liu ◽  
Steven D. Woodruff ◽  
Benjamin T. Chorpening ◽  
Michael P. Buric

2017 ◽  
Vol 43 (1) ◽  
pp. 62 ◽  
Author(s):  
Shuo Yang ◽  
Daniel Homa ◽  
Gary Pickrell ◽  
Anbo Wang

2019 ◽  
Vol 127 (10) ◽  
pp. 532
Author(s):  
С.Д. Абдурахмонов ◽  
В.С. Горелик

AbstractOvertone bands in the spectral range of 1300−1920 cm^–1 have been found in Raman scattering spectrum of lithium tantalate single crystals. The Raman spectra were recorded in the 180° scattering geometry. The intensity of overtone transitions differs for different samples and, in some cases, is comparable with the Raman scattering intensity at the fundamental modes of a lithium tantalate single crystal.


1994 ◽  
Vol 365 ◽  
Author(s):  
Matithew A. Stough ◽  
John R. Hellmann

ABSTRACTPolycrystalline zirconia-coated single crystal sapphire fiber displays reconstruction of the sapphire surface in regions of contact with zirconia grains. This is a concern where ZrO2 -coated sapphire fiber is desired for reinforcement of ceramic matrices. Previous work has demonstrated pitting is partially attributed to impurity-induced transient liquid phase formation with local dissolution of alumina; however, the extent of reconstruction witnessed via microscopy suggests that other mechanisms are active. The present study has addressed the issue of solid solubility and interdiffusivity to more thoroughly understand the solid state mechanisms contributing to pitting. Single crystal sapphire and zirconia were ion implanted with zirconium and yttrium, and aluminum, respectively, and then subjected to diffusion anneals at 1200° - 1600°C to study redistribution of implanted cations. Secondary Ion Mass Spectroscopy (SIMS) was used to profile the redistribution of implanted ions for measurement of diffusion coefficients and solubility limits after heat treatments. The results will offer a significant set of data on interface stability in the alumina/zirconia system.


2003 ◽  
Vol 21 (10) ◽  
pp. 2276-2283 ◽  
Author(s):  
Hai Xiao ◽  
Jiangdong Deng ◽  
G. Pickrell ◽  
R.G. May ◽  
Anbo Wang

2011 ◽  
Vol 36 (7) ◽  
pp. 1287 ◽  
Author(s):  
Cody Raml ◽  
Xiangnan He ◽  
Ming Han ◽  
Dennis R. Alexander ◽  
Yongfeng Lu

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