Optimal design of line-scan focal modulation microscopy: a theoretical approach (Conference Presentation)

2018 ◽  
Author(s):  
Nanguang Chen ◽  
Shuhao Shen ◽  
Shilpa Pant
Keyword(s):  
Optimal Design ◽  
Theoretical Approach ◽  
Line Scan

scholarly journals A novel combined experimental and multiscale theoretical approach to unravel the structure of SiC/SiOx core/shell nanowires for their optimal design

Nanoscale ◽  
2018 ◽  
Vol 10 (28) ◽  
pp. 13449-13461 ◽  
Author(s):  
Tommaso Morresi ◽  
Melanie Timpel ◽  
Andrea Pedrielli ◽  
Giovanni Garberoglio ◽  
Roberta Tatti ◽  
...  
Keyword(s):  
Optimal Design ◽  
Theoretical Approach ◽  
Realistic Model ◽  
Core Shell ◽  
Shell Nanowires

A realistic model of SiC/SiOx core/shell nanowires to reproduce XAS spectra.

Arsenic segregation in polysilicon

1983 ◽  
Vol 41 ◽  
pp. 154-155 ◽  
Author(s):  
P.E. Batson ◽  
C.R.M. Grovenor ◽  
D.A. Smith ◽  
C. Wong
Keyword(s):  
Incident Beam ◽  
Silicon Wafers ◽  
Chemical Polishing ◽  
Bright Field Image ◽  
Beam Size ◽  
Stem Analysis ◽  
Bright Field ◽  
Twin Boundaries ◽  
X Ray ◽  
Line Scan

In this work As doped polysilicon was deposited onto (100) silicon wafers by APCVD at 660°C from a silane-arsine mixture, followed by a ten minute anneal at 1000°C, and in one case a further ten minute anneal at 700°C. Specimens for TEM and STEM analysis were prepared by chemical polishing. The microstructure, which is unchanged by the final 700°C anneal,is shown in Figure 1. It consists of numerous randomly oriented grains many of which contain twins.X-ray analysis was carried out in a VG HB5 STEM. As K α x-ray counts were collected from STEM scans across grain and twin boundaries, Figures 2-4. The incident beam size was about 1.5nm in diameter, and each of the 20 channels in the plots was sampled from a 1.6nm length of the approximately 30nm line scan across the boundary. The bright field image profile along the scanned line was monitored during the analysis to allow correlation between the image and the x-ray signal.

Differential polarization imaging of sickled cells

1988 ◽  
Vol 46 ◽  
pp. 62-63
Author(s):  
Marcos F. Maestre
Keyword(s):  
Optical Properties ◽  
Theoretical Approach ◽  
Polarized Light ◽  
Polarization Microscopy ◽  
Spectroscopic Techniques ◽  
Polarization Imaging ◽  
Circularly Polarized Light ◽  
Circularly Polarized ◽  
Microscopic Scale ◽  
Chiral Structures

Recently we have developed a form of polarization microscopy that forms images using optical properties that have previously been limited to macroscopic samples. This has given us a new window into the distribution of structure on a microscopic scale. We have coined the name differential polarization microscopy to identify the images obtained that are due to certain polarization dependent effects. Differential polarization microscopy has its origins in various spectroscopic techniques that have been used to study longer range structures in solution as well as solids. The differential scattering of circularly polarized light has been shown to be dependent on the long range chiral order, both theoretically and experimentally. The same theoretical approach was used to show that images due to differential scattering of circularly polarized light will give images dependent on chiral structures. With large helices (greater than the wavelength of light) the pitch and radius of the helix could be measured directly from these images.

Crack divergence phenomena in tempered glass

2020 ◽  
Vol 13 (3) ◽  
pp. 115-129
Author(s):  
Shin’ichi Aratani
Keyword(s):  
Optimal Design ◽  
High Speed ◽  
Glass Plate ◽  
Acute Angle ◽  
Divergence Angle ◽  
High Speed Photography ◽  
Tempered Glass ◽  
Thick Glass

High speed photography using the Cranz-Schardin camera was performed to study the crack divergence and divergence angle in thermally tempered glass. A tempered 3.5 mm thick glass plate was used as a specimen. It was shown that two types of bifurcation and branching existed as the crack divergence. The divergence angle was smaller than the value calculated from the principle of optimal design and showed an acute angle.

G Optimal Design in Non linear Models to Increase Silicon Oxide Purity Levels and Electrical Conductivity

2018 ◽  
pp. 150-155
Author(s):  
Muklas Rivai
Keyword(s):  
Electrical Conductivity ◽  
Optimal Design ◽  
Linear Models ◽  
Silicon Oxide ◽  
Information Matrix ◽  
Relevant Information ◽  
Non Linear

Optimal design is a design which required in determining the points of variable factors that would be attempted to optimize the relevant information so that fulfilled the desired criteria. The optimal fulfillment criteria based on the information matrix of the selected model.

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