Vertical ozone flux in the near-surface layer of a background region of Western Siberia in 2016
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Recombination Characteristics of Single-Crystalline Silicon Wafers with a Damaged Near-Surface Layer
2013 ◽
Vol 58
(2)
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pp. 142-150
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2020 ◽
Vol 1713
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pp. 012037
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2014 ◽
Vol 101
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pp. 244-248
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