Keyhole imaging method for dynamic objects behind the occlusion area

Author(s):  
Liquan Dong ◽  
Ming Liu ◽  
Yuejin Zhao ◽  
Mei Hui ◽  
Xiaohua Liu ◽  
...  
Author(s):  
T. Y. Tan ◽  
W. K. Tice

In studying ion implanted semiconductors and fast neutron irradiated metals, the need for characterizing small dislocation loops having diameters of a few hundred angstrom units usually arises. The weak beam imaging method is a powerful technique for analyzing these loops. Because of the large reduction in stacking fault (SF) fringe spacing at large sg, this method allows for a rapid determination of whether the loop is faulted, and, hence, whether it is a perfect or a Frank partial loop. This method was first used by Bicknell to image small faulted loops in boron implanted silicon. He explained the fringe spacing by kinematical theory, i.e., ≃l/(Sg) in the fault fringe in depth oscillation. The fault image contrast formation mechanism is, however, really more complicated.


Author(s):  
Akira Tonomura

Electron holography is a two-step imaging method. However, the ultimate performance of holographic imaging is mainly determined by the brightness of the electron beam used in the hologram-formation process. In our 350kV holography electron microscope (see Fig. 1), the decrease in the inherently high brightness of field-emitted electrons is minimized by superposing a magnetic lens in the gun, for a resulting value of 2 × 109 A/cm2 sr. This high brightness has lead to the following distinguished features. The minimum spacing (d) of carrier fringes is d = 0.09 Å, thus allowing a reconstructed image with a resolution, at least in principle, as high as 3d=0.3 Å. The precision in phase measurement can be as high as 2π/100, since the position of fringes can be known precisely from a high-contrast hologram formed under highly collimated illumination. Dynamic observation becomes possible because the current density is high.


2011 ◽  
Vol 59 (S 01) ◽  
Author(s):  
S Ihlenburg ◽  
A Rüffer ◽  
T Radkow ◽  
A Purbojo ◽  
M Glöckler ◽  
...  

2008 ◽  
Vol 39 (01) ◽  
Author(s):  
AJ Fallgatter ◽  
AC Ehlis ◽  
MM Richter ◽  
M Schecklmann ◽  
MM Plichta

Metrologiya ◽  
2020 ◽  
pp. 25-42
Author(s):  
Dmitrii V. Khablov

This paper describes a promising method for non-contact vibration diagnostics based on the use of Doppler microwave sensors. In this case, active irradiation of the object with electromagnetic waves and the allocation of phase changes using two-channel quadrature processing of the received reflected signal are used. The modes of further fine analysis of the resulting signal using spectral or wavelet transformations depending on the nature of the active vibration are considered. The advantages of this non-contact and remote vibration analysis method for the study of complex dynamic objects are described. The convenience of the method for machine learning and use in intelligent systems of non-destructive continuous monitoring of the state of these objects by vibration is noted.


2013 ◽  
Vol E96.B (7) ◽  
pp. 2014-2023 ◽  
Author(s):  
Ryo YAMAGUCHI ◽  
Shouhei KIDERA ◽  
Tetsuo KIRIMOTO

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