Polarization analysis of retroreflection from commercial off the shelf (COTS) sensors

2017 ◽  
Author(s):  
Frances Bodrucki ◽  
Scott Williams ◽  
Rich Cooke ◽  
Glenn Boreman
Keyword(s):  
Polarization Analysis ◽  
Commercial Off The Shelf

Imaging magnetic microstructure with SEMPA

1993 ◽  
Vol 51 ◽  
pp. 1032-1033
Author(s):  
M. H. Kelley ◽  
J. Unguris ◽  
R. J. Celotta ◽  
D. T. Pierce
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Sandwich Structure ◽  
Magnetic Coupling ◽  
Polarization Analysis ◽  
Secondary Electrons ◽  
Magnetic Microstructure ◽  
Escape Depth ◽  
Scanning Electron

By measuring the spin polarization of secondary electrons generated in a scanning electron microscope, scanning electron microscopy with polarization analysis (SEMPA) can directly image the magnitude and direction of a material’s magnetization. Because the escape depth of the secondaries is only on the order of 1 nm, SEMPA is especially well-suited for investigating the magnetization of ultra-thin films and surfaces. We have exploited this feature of SEMPA to study the magnetic microstrcture and magnetic coupling in ferromagnetic multilayers where the layers may only be a few atomic layers thick. For example, we have measured the magnetic coupling in Fe/Cr/Fe(100) and Fe/Ag/Fe(100) trilayers and have found that the coupling oscillates between ferromagnetic and antiferromagnetic as a function of the Cr or Ag spacer thickness.The SEMPA apparatus has been described in detail elsewhere. The sample consisted of a magnetic sandwich structure with a wedge-shaped interlayer as shown in Fig. 1.

POLARIZATION ANALYSIS OF THE MAGNETIC DIFFUSE SCATTERING OF Na3Cr2P3O12

1988 ◽  
Vol 49 (C8) ◽  
pp. C8-199-C8-200
Author(s):  
N. Fanjat ◽  
O. Schaerpf ◽  
J. L. Soubeyroux ◽  
A. J. Dianoux ◽  
G. Lucazeau
Keyword(s):  
Diffuse Scattering ◽  
Polarization Analysis
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