Status of the metrology laboratory for the LCLS II project (Conference Presentation)

Advances in Metrology for X-Ray and EUV Optics VII ◽

10.1117/12.2275562 ◽

2017 ◽

Author(s):

May Ling Ng ◽

Corey L. Hardin ◽

Josep Nicolas ◽

Daniele Cocco

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