In-situ stress measurement of single and multilayer thin-films used in x-ray astronomy optics applications
Keyword(s):
X Ray
◽
2000 ◽
Vol 128-129
◽
pp. 474-478
◽
2001 ◽
pp. 9251-9257
◽
2013 ◽
Vol 734-737
◽
pp. 759-763
◽
2017 ◽
Vol 36
(3)
◽
pp. 1907-1917
◽
Keyword(s):