Speckle-based portable device for in-situ metrology of x-ray mirrors at Diamond Light Source

2017 ◽  
Author(s):  
Hongchang Wang ◽  
Tunhe Zhou ◽  
Yogesh Kashyap ◽  
Kawal J. S. Sawhney
Keyword(s):  
Light Source ◽  
Portable Device ◽  
X Ray ◽  
In Situ Metrology

scholarly journals Advanced in situ metrology for x-ray beam shaping with super precision

2015 ◽  
Vol 23 (2) ◽  
pp. 1605 ◽  
Author(s):  
Hongchang Wang ◽  
John Sutter ◽  
Kawal Sawhney
Keyword(s):  
Beam Shaping ◽  
X Ray ◽  
In Situ Metrology

In-situ metrology for adaptive x-ray optics with an in-position LTP system in the soft x-ray beamline

2020 ◽  
Author(s):  
Shang-Wei Lin ◽  
Duan-Jen Wang ◽  
Chih-Yu Hua ◽  
Hok-Sum Fung ◽  
Ming-Ying Hsu ◽  
...  
Keyword(s):  
Ray Optics ◽  
X Ray ◽  
In Situ Metrology

scholarly journals A new on-axis multimode spectrometer for the macromolecular crystallography beamlines of the Swiss Light Source

2009 ◽  
Vol 16 (2) ◽  
pp. 173-182 ◽  
Author(s):  
Robin L. Owen ◽  
Arwen R. Pearson ◽  
Alke Meents ◽  
Pirmin Boehler ◽  
Vincent Thominet ◽  
...  
Keyword(s):  
Light Source ◽  
Three Dimensional ◽  
Dimensional Structure ◽  
X Ray ◽  
X Ray Crystallography ◽  
Additional Information ◽  
Swiss Light Source ◽  
Induced Changes ◽  
Insight Into

X-ray crystallography at third-generation synchrotron sources permits tremendous insight into the three-dimensional structure of macromolecules. Additional information is, however, often required to aid the transition from structure to function. In situ spectroscopic methods such as UV–Vis absorption and (resonance) Raman can provide this, and can also provide a means of detecting X-ray-induced changes. Here, preliminary results are introduced from an on-axis UV–Vis absorption and Raman multimode spectrometer currently being integrated into the beamline environment at X10SA of the Swiss Light Source. The continuing development of the spectrometer is also outlined.

The lower energy diffraction and scattering side-bounce beamline for materials science at the Canadian Light Source

2021 ◽  
Vol 28 (3) ◽  
Author(s):  
Adam F. G. Leontowich ◽  
Ariel Gomez ◽  
Beatriz Diaz Moreno ◽  
David Muir ◽  
Denis Spasyuk ◽  
...  
Keyword(s):  
Light Source ◽  
Materials Science ◽  
Design Parameters ◽  
X Ray ◽  
Single Side ◽  
Cylindrical Mirror ◽  
Sample Position ◽  
Optical Configuration ◽  
Focused Beam

A new diffraction beamline for materials science has been built at the Canadian Light Source synchrotron. The X-ray source is an in-vacuum wiggler with a 2.5 T peak magnetic field at 5.2 mm gap. The optical configuration includes a toroidal mirror, a single side-bounce Bragg monochromator, and a cylindrical mirror, producing a sub-150 µm vertical × 500 µm horizontal focused beam with a photon energy range of 7–22 keV and a flux of 1012 photons per second at the sample position. Three endstations are currently open to general users, and the techniques available include high-resolution powder diffraction, small molecule crystallography, X-ray reflectivity, in situ rapid thermal annealing, and SAXS/WAXS. The beamline design parameters, calculated and measured performance, and initial experimental results are presented to demonstrate the capabilities for materials science.

Microdiffraction Study of Polycrystalline Copper during Uniaxial Tension Deformation Using a Synchrotron X-Ray Source

2005 ◽  
Vol 475-479 ◽  
pp. 4149-4152
Author(s):  
H.D. Joo ◽  
J.S. Kim ◽  
C.W. Bark ◽  
J.Y. Kim ◽  
Yang Mo Koo ◽  
...  
Keyword(s):  
Uniaxial Tension ◽  
Light Source ◽  
In Situ Measurement ◽  
Uniaxial Loading ◽  
Polycrystalline Copper ◽  
Slip Systems ◽  
Local Orientation ◽  
X Ray ◽  
Selection Of

In-situ measurement of local orientation and strain Has Been carried out for a copperpolycrystals under a uniaxial loading using a synchrotron x-ray microdiffraction method at the Advanced Light Source. The heterogeneities of deformation-induced microstructure within single grains were observed. There were differences in the selection of simultaneously acting slip systems among neighboring volume elements within a grain.

Simultaneous measurement of X-ray powder diffraction and ferroelectric polarisation data as a function of applied electric field at a range of frequencies

2013 ◽  
Vol 28 (S2) ◽  
pp. S220-S227 ◽  
Author(s):  
Stephanie Ryding ◽  
Robert Cernik ◽  
Jenny Wooldridge ◽  
Tim L Burnett ◽  
Mark Stewart ◽  
...  
Keyword(s):  
Electric Field ◽  
Light Source ◽  
Variable Frequency ◽  
Time Data ◽  
X Ray ◽  
Real Time Data ◽  
User Facility ◽  
Xrd Patterns ◽  
Collection Methods

A variable frequency ferroelectric polarisation measurement system has been designed and built at the UK's Diamond Light Source. The electric field induced phase transitions in Pb(Zr1−xTix)O3 (PZT) have been used to test the facility via in-situ measurements of electric polarisation and XRD. Stroboscopic and real time data collection methods on polycrystalline samples were employed as a function of frequency to determine the dynamic ferroelectric response. The system has been shown to deliver XRD patterns of good statistical quality measured over 40 points of a ferroelectric PE loop. The system is now available on station I11 as a user facility at the Diamond Light Source.

High-pressure sapphire capillary cell for synchrotron single-crystal X-ray diffraction measurements to 1500 bar

2020 ◽  
Vol 53 (6) ◽  
pp. 1519-1523
Author(s):  
Charles J. McMonagle ◽  
David R. Allan ◽  
Mark R. Warren ◽  
Konstantin V. Kamenev ◽  
Gemma F. Turner ◽  
...  
Keyword(s):  
High Pressure ◽  
Single Crystal ◽  
Capillary Pressure ◽  
Light Source ◽  
X Ray Diffraction ◽  
X Ray ◽  
Accuracy And Precision ◽  
Component Cell ◽  
Deuterated Analogue

A new sapphire capillary pressure cell for single-crystal X-ray diffraction measurements at moderate pressures (200−1500 bar; 1 bar = 100 kPa) has been developed and optimized for use on beamline I19 at Diamond Light Source. The three-component cell permits optical centring of the crystal and in situ pressure modification to a precision of 1 bar. Compression of hexamethylenetetramine and its deuterated analogue to 1000 bar was performed, showcasing the accuracy and precision of the measurements, and highlighting evidence of a geometric isotope effect.

scholarly journals Synchrotron X-ray Micro Tomography at the Advanced Light Source: In-Situ Sample Environments for Advanced Aerospace Materials

2018 ◽  
Vol 24 (S2) ◽  
pp. 444-445
Author(s):  
Harold S. Barnard ◽  
A.A Macdowell ◽  
D.Y. Parkinson ◽  
N.M. Larson ◽  
J.C. Peterson ◽  
...  
Keyword(s):  
Light Source ◽  
Aerospace Materials ◽  
X Ray ◽  
Advanced Light Source ◽  
Micro Tomography
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