Plasmonic nonlinear optical components (Conference Presentation)

2017 ◽  
Author(s):  
Euclides Almeida ◽  
Yehiam Prior
Keyword(s):  
Nonlinear Optical ◽  
Optical Components

scholarly journals Time-domain and frequency-domain modeling of nonlinear optical components at the circuit-level using a node-based approach

2012 ◽  
Vol 29 (5) ◽  
pp. 896 ◽  
Author(s):  
Martin Fiers ◽  
Thomas Van Vaerenbergh ◽  
Ken Caluwaerts ◽  
Dries Vande Ginste ◽  
Benjamin Schrauwen ◽  
...  
Keyword(s):  
Frequency Domain ◽  
Time Domain ◽  
Nonlinear Optical ◽  
Domain Modeling ◽  
Optical Components

Nonlinear optical components with liquid crystals

1991 ◽  
Author(s):  
Mihaela A. Dumitru ◽  
Maria Honciuc ◽  
Livia Sterian
Keyword(s):  
Liquid Crystals ◽  
Nonlinear Optical ◽  
Optical Components

scholarly journals Nonlinear optical components for all-optical probabilistic graphical model

2018 ◽  
Vol 9 (1) ◽  
Author(s):  
Masoud Babaeian ◽  
Pierre-A. Blanche ◽  
Robert A. Norwood ◽  
Tommi Kaplas ◽  
Patrick Keiffer ◽  
...  
Keyword(s):  
Nonlinear Optical ◽  
Graphical Model ◽  
Probabilistic Graphical Model ◽  
Optical Components ◽  
All Optical

scholarly journals High Power Lasers and Novel Optics for Laser Interferometric Gravitational Wave Detectors

1995 ◽  
Vol 48 (6) ◽  
pp. 999 ◽  
Author(s):  
PJ Veitch ◽  
J Munch ◽  
MW Hamilton ◽  
D Ottaway ◽  
A Greentree ◽  
...  
Keyword(s):  
Gravitational Wave ◽  
High Power ◽  
Nonlinear Optical ◽  
Second Generation ◽  
Low Noise ◽  
Optical Components ◽  
High Power Lasers ◽  
Long Baseline ◽  
Early Results ◽  
Laser Interferometric

Research at Adelaide is directed towards the development of critical optical components for second generation long baseline gravitational wave interferometers. In particular, the development of high power, low noise lasers, and an investigation to determine the potential of holographic, diffractive and nonlinear optical components for solving some of the problems which could limit the sensitivity of second generation detectors. In this paper we will outline the proposed research and present some early results.

Preparation of Thin Cadmium Telluride Samples for Electron Microscope Studies

1974 ◽  
Vol 32 ◽  
pp. 548-549
Author(s):  
T. J. Magee ◽  
J. Peng ◽  
J. Bean
Keyword(s):  
Electron Microscope ◽  
Sulfuric Acid ◽  
Solid State ◽  
Sample Preparation ◽  
Cadmium Telluride ◽  
Potassium Dichromate ◽  
Optical Components ◽  
The Past ◽  
Solid State Devices

Cadmium telluride has become increasingly important in a number of technological applications, particularly in the area of laser-optical components and solid state devices, Microstructural characterizations of the material have in the past been somewhat limited because of the lack of suitable sample preparation and thinning techniques. Utilizing a modified jet thinning apparatus and a potassium dichromate-sulfuric acid thinning solution, a procedure has now been developed for obtaining thin contamination-free samples for TEM examination.

Roughness measurements of nonlinear optical polymer films by scanning tunneling microscopy

1989 ◽  
Vol 47 ◽  
pp. 22-23
Author(s):  
I. H. Musselman ◽  
R.-T. Chen ◽  
P. E. Russell
Keyword(s):  
Surface Roughness ◽  
Scanning Tunneling Microscopy ◽  
Nonlinear Optical ◽  
Polymer Surface ◽  
Light Extinction ◽  
Scanning Tunneling ◽  
Silicon Substrates ◽  
Tunneling Microscopy ◽  
Optical Polymer ◽  
Total Light

Scanning tunneling microscopy (STM) has been used to characterize the surface roughness of nonlinear optical (NLO) polymers. A review of STM of polymer surfaces is included in this volume. The NLO polymers are instrumental in the development of electrooptical waveguide devices, the most fundamental of which is the modulator. The most common modulator design is the Mach Zehnder interferometer, in which the input light is split into two legs and then recombined into a common output within the two dimensional waveguide. A π phase retardation, resulting in total light extinction at the output of the interferometer, can be achieved by changing the refractive index of one leg with respect to the other using the electrooptic effect. For best device performance, it is essential that the NLO polymer exhibit minimal surface roughness in order to reduce light scattering. Scanning tunneling microscopy, with its high lateral and vertical resolution, is capable of quantifying the NLO polymer surface roughness induced by processing. Results are presented below in which STM was used to measure the surface roughness of films produced by spin-coating NLO-active polymers onto silicon substrates.

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