A comparative study of carrier lifetimes in ESWIR and MWIR materials: HgCdTe, InGaAs, InAsSb, and GeSn (Conference Presentation)
2001 ◽
Vol 268
(6)
◽
pp. 1739-1748
2001 ◽
Vol 48
(2)
◽
pp. 97-106
◽