Achieving subpixel resolution with time-correlated transient signals in pixelated CdZnTe gamma-ray sensors using a focused laser beam (Conference Presentation)

Author(s):  
Luis A. Ocampo Giraldo ◽  
Aleksey E. Bolotnikov ◽  
Giuseppe S. Camarda ◽  
Yonggang Cui ◽  
Gianluigi De Geronimo ◽  
...  
2018 ◽  
Vol 178 ◽  
pp. 01002
Author(s):  
N.V. Zamfir

The new research facility Extreme Light Infrastructure – Nuclear Physics (ELI-NP) is under construction in Romania, on the Magurele Physics campus. Valued more than 300 Meuros the center will be operational in 2019. The research center will use a high brilliance Gamma Beam and a High-power Laser beam, with unprecedented characteristics worldwide, to investigate the interaction of very intense radiation with matter with specific focus on nuclear phenomena and their applications. The energetic particle beams and radiation produced by the 2x10 PW laser beam interacting with matter will be studied. The precisely tunable energy and excellent bandwidth of the gamma-ray beam will allow for new experimental approaches regarding nuclear astrophysics, nuclear resonance fluorescence, and applications. The experimental equipment is presented, together with the main directions of the research envisioned with special emphasizes on nuclear physics studies.


1982 ◽  
Vol 17 ◽  
Author(s):  
E. Poon ◽  
H.L. Evans ◽  
W. Hwang ◽  
R.M. Osgood ◽  
E.S. Yang

ABSTRACTAn experimental technique has been developed to study the electrical properties of semiconductor grain boundaries (GBs) by a focused laser beam. The laser beam is trained on a GB while the photoconductivity of the sample is measured. Both the steady-state and transient signals are recorded as functions of temperature. From these data, we obtain well-defined GB parameters, including the barrier height, interface charge density, trap energy and thermal capture cross-section. This technique allows us to examine localized regions of individual GBs in a semiconductor with multiple grains.


1967 ◽  
Vol 31 ◽  
pp. 469-471
Author(s):  
J. G. Duthie ◽  
M. P. Savedoff ◽  
R. Cobb
Keyword(s):  

A source of gamma rays has been found at right ascension 20h15m, declination +35°, with an uncertainty of 6° in each coordinate. Its flux is (1·5 ± 0·8) x 10-4photons cm-2sec-1at 100 MeV. Possible identifications are reviewed, but no conclusion is reached. The mechanism producing the radiation is also uncertain.


1994 ◽  
Vol 144 ◽  
pp. 635-639
Author(s):  
J. Baláž ◽  
A. V. Dmitriev ◽  
M. A. Kovalevskaya ◽  
K. Kudela ◽  
S. N. Kuznetsov ◽  
...  

AbstractThe experiment SONG (SOlar Neutron and Gamma rays) for the low altitude satellite CORONAS-I is described. The instrument is capable to provide gamma-ray line and continuum detection in the energy range 0.1 – 100 MeV as well as detection of neutrons with energies above 30 MeV. As a by-product, the electrons in the range 11 – 108 MeV will be measured too. The pulse shape discrimination technique (PSD) is used.


Author(s):  
David W. Piston ◽  
Brian D. Bennett ◽  
Robert G. Summers

Two-photon excitation microscopy (TPEM) provides attractive advantages over confocal microscopy for three-dimensionally resolved fluorescence imaging and photochemistry. Two-photon excitation arises from the simultaneous absorption of two photons in a single quantitized event whose probability is proportional to the square of the instantaneous intensity. For example, two red photons can cause the transition to an excited electronic state normally reached by absorption in the ultraviolet. In practice, two-photon excitation is made possible by the very high local instantaneous intensity provided by a combination of diffraction-limited focusing of a single laser beam in the microscope and the temporal concentration of 100 femtosecond pulses generated by a mode-locked laser. Resultant peak excitation intensities are 106 times greater than the CW intensities used in confocal microscopy, but the pulse duty cycle of 10-5 maintains the average input power on the order of 10 mW, only slightly greater than the power normally used in confocal microscopy.


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