Asynchronous Geiger-mode APD cameras with free-running InGaAsP pixels (Conference Presentation)

2017 ◽  
Author(s):  
Mark Itzler ◽  
Gennaro Salzano ◽  
Mark Entwistle ◽  
Xudong Jiang ◽  
Mark Owens ◽  
...  
Keyword(s):  
Geiger Mode ◽  
Free Running

Single-Element Passive Quenching with Active Reset Circuit for Single Photon Avalanche Diodes

2014 ◽  
Vol 644-650 ◽  
pp. 3709-3712
Author(s):  
Chong Hu ◽  
Teh Hua Ju ◽  
Yong Yao
Keyword(s):  
Single Photon ◽  
Single Element ◽  
Similar Function ◽  
Operation Mechanism ◽  
Mode Operation ◽  
Avalanche Diodes ◽  
Geiger Mode ◽  
Free Running ◽  
Future Work ◽  
Single Photon Avalanche Diodes

A single-element passive quenching with active reset (PQAR) circuit is proposed. Its operation mechanism is studied in theory to show that this single element, based on thyristor, can provide similar function of quenching and reset for the free-running Geiger-mode operation of single photon avalanche diodes (SPADs) as the conventional PQAR circuits, but with significant simplicity. Requirement for the thyristor is identified, and an InP sample was designed, fabricated and characterized. Future work for further demonstration is also discussed.

scholarly journals Asynchronous InGaAsP Geiger-Mode APD Cameras With Free-Running Pixel Operation

2016 ◽  
Author(s):  
Mark A. Itzler ◽  
Mark Entwistle ◽  
Xudong Jiang ◽  
Gennaro Salzano ◽  
Mark Owens ◽  
...  
Keyword(s):  
Geiger Mode ◽  
Free Running

Universal Performance Prediction for Gated and Free-Running Geiger-Mode Avalanche Photodiodes

2016 ◽  
Vol 28 (17) ◽  
pp. 1890-1893 ◽  
Author(s):  
Peng Zhao ◽  
Yan Zhang ◽  
Kunpeng Wang ◽  
Weiping Qian
Keyword(s):  
Performance Prediction ◽  
Avalanche Photodiodes ◽  
Geiger Mode ◽  
Free Running

Phase Noise Measurement of Optical Heterodyning Two-Tone Signal Generated by Two Free-Running Lasers

2013 ◽  
Vol E96.C (2) ◽  
pp. 241-244
Author(s):  
Ryuta YAMANAKA ◽  
Taka FUJITA ◽  
Hideyuki SOTOBAYASHI ◽  
Atsushi KANNO ◽  
Tetsuya KAWANISHI
Keyword(s):  
Phase Noise ◽  
Noise Measurement ◽  
Tone Signal ◽  
Free Running

Fault Localization and Functional Testing of ICs by Lock-in Thermography

2002 ◽  
Author(s):  
O. Breitenstein ◽  
J.P. Rakotoniaina ◽  
F. Altmann ◽  
J. Schulz ◽  
G. Linse
Keyword(s):  
Spatial Resolution ◽  
Electronic Device ◽  
Imaging Techniques ◽  
Heat Diffusion ◽  
Acquisition Time ◽  
Temperature Modulation ◽  
Heat Sources ◽  
Ir Camera ◽  
Free Running ◽  
Lock In

Abstract In this paper new thermographic techniques with significant improved temperature and/or spatial resolution are presented and compared with existing techniques. In infrared (IR) lock-in thermography heat sources in an electronic device are periodically activated electrically, and the surface is imaged by a free-running IR camera. By computer processing and averaging the images over a certain acquisition time, a surface temperature modulation below 100 µK can be resolved. Moreover, the effective spatial resolution is considerably improved compared to stead-state thermal imaging techniques, since the lateral heat diffusion is suppressed in this a.c. technique. However, a serious limitation is that the spatial resolution is limited to about 5 microns due to the IR wavelength range of 3 -5 µm used by the IR camera. Nevertheless, we demonstrate that lock-in thermography reliably allows the detection of defects in ICs if their power exceeds some 10 µW. The imaging can be performed also through the silicon substrate from the backside of the chip. Also the well-known fluorescent microthermal imaging (FMI) technique can be be used in lock-in mode, leading to a temperature resolution in the mK range, but a spatial resolution below 1 micron.

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