Diffraction optical elements with deep phase profile obtained with the use of x-ray parallel intensive beam

Author(s):  
Voldemar P. Koronkevich ◽  
G. N. Kulipanov ◽  
Oleg A. Makarov ◽  
Vladimir Nazmov ◽  
Valery F. Pindyurin ◽  
...  
1996 ◽  
Author(s):  
Oleg A. Makarov ◽  
Zheng Chen ◽  
Azalia A. Krasnoperova ◽  
Franco Cerrina ◽  
Vadim V. Cherkashin ◽  
...  

Author(s):  
E.G Churin ◽  
V.P Koronkevich ◽  
G.N Kulipanov ◽  
O.A Makarov ◽  
L.A Mezentseva ◽  
...  
Keyword(s):  

2009 ◽  
Author(s):  
D. Margarone ◽  
M. Kozlova ◽  
J. Nejdl ◽  
B. Rus ◽  
T. Mocek ◽  
...  

2017 ◽  
Vol 50 (2) ◽  
pp. 475-480 ◽  
Author(s):  
Peter Zaumseil

Four different SiGe/Si layer structures, pseudomorphically grown and (partially) relaxed, are used as examples to demonstrate that reflections in symmetric skew geometry can successfully be used to realize a complex analysis of these systems. Taking the intensity exactly along the truncation rod of a reciprocal lattice point, it is possible to simulate this diffraction curve and determine the layer parameter in the projection according to the netplane tilt relative to the surface. The main precondition for this technique and for performing reciprocal space mapping with sufficiently high resolution is a low angular divergence of the incident and detected beams perpendicular to the diffraction plane, which can also be achieved by suitable optical elements on laboratory-based diffractometers.


1998 ◽  
Vol 5 (5) ◽  
pp. 1243-1249 ◽  
Author(s):  
José I. Espeso ◽  
Peter Cloetens ◽  
José Baruchel ◽  
Jürgen Härtwig ◽  
Trevor Mairs ◽  
...  

The lateral coherence length is of the order of 100 µm at the `long' (145 m) ID19 beamline of the ESRF, which is mainly devoted to imaging. Most of the optical elements located along the X-ray path can thus act as `phase objects', and lead to spurious contrast and/or to coherence degradation, which shows up as an enhanced effective angular size of the source. Both the spurious contrast and the coherence degradation are detrimental for the images (diffraction topographs, tomographs, phase-contrast images) produced at this beamline. The problems identified and the way they were solved during the commissioning of ID19 are reported. More particularly, the role of the protection foils located in the front end, the beryllium windows, the filters and the monochromator defects (scratches, dust, small vibrations) is discussed.


2012 ◽  
Author(s):  
Takashi Imazono ◽  
Naoji Moriya ◽  
Yoshihisa Harada ◽  
Kazuo Sano ◽  
Masato Koike

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