Leakage current, self-clearing and actuation efficiency of nanometer-thin, low-voltage dielectric elastomer transducers tailored by thermal evaporation

Author(s):  
Tino Töpper ◽  
Bekim Osmani ◽  
Samuel Lörcher ◽  
Bert Müller
2015 ◽  
Vol 11 (2) ◽  
pp. 3017-3022
Author(s):  
Gurban Akhmedov

Results of researches show, that film p-n the structures received by a method of discrete thermal evaporation in a uniform work cycle, are suitable for use in low-voltage devices.  As a result of work are received p-n heterojunctions in thin-film execution, described by high values of differential resistance. Show that, thermo endurance - T0 maybe using as characteristic of thermo endurance of optic materials. If heating flow, destruction temperature and internal surface temperature is measured during test, it is possible to determine value T0 and other necessity characteristics. As a result of the taking test was lead to comparison evaluation of considered materials. Working range of heating flow and up level heating embark have been determined.


2017 ◽  
Vol 3 (8) ◽  
pp. 1700073 ◽  
Author(s):  
Tino Töpper ◽  
Samuel Lörcher ◽  
Hans Deyhle ◽  
Bekim Osmani ◽  
Vanessa Leung ◽  
...  

2014 ◽  
Vol 975 ◽  
pp. 168-172
Author(s):  
Tiago Delbrücke ◽  
Igor Schmidt ◽  
Sergio Cava ◽  
Vânia Caldas Sousa

The addition of different dopants affects the densification and electrical properties of TiO2 based varistor ceramics. The nonlinear current (I) and voltage (V) characteristics of titanium dioxide are examined when doped with small quantities (0.5-2 at.%) of strontium oxide. This paper discusses the electrical properties of such an SrO doped TiO2 system, and demonstrates that some combinations produce electrical properties suitable for use as low voltage varistors. The high value of the nonlinear coefficient (α) (6.6), the breakdown field strength (Eb) (328 V/cm) and the leakage current (Ir) (0.22 mA/cm2) obtained in a system newly doped with SrO, are all adequate properties for application in low voltage varistors.


2004 ◽  
Vol 830 ◽  
Author(s):  
Osamu Matsuura ◽  
Hideki Yamawaki ◽  
Masaki Nakabayashi ◽  
Yoshimasa Horii ◽  
Yoshihiro Sugiyama

ABSTRACTWe studied the Nb doping effect on the electrical characteristics of MOCVD-PZT capacitors using uniformly Nb-doped Pb(Zr, Ti)O3 (UND-PZT) and δ-Nb-doped PZT (DND-PZT) prepared by MOCVD. The 2Pr for UND-PZT was small and the UND-PZT hysteresis shifted in a positive direction. However, the 2Pr for DND-PZT decreased by only 5.5% and the hysteresis of DND-PZT didn't shift. In addition, the leakage current of DND-PZT decreased by one order at low bias compared to non-doped PZT, because the δ-Nb-doping layer maintains the barrier height, higher than that of none-doped PZT due to defect compensation. As a result, Nb1% DND-PZT was well suited to use Nb doping which decreases leakage current at low voltage and maintains 2Pr.


2005 ◽  
Vol 20 (8) ◽  
pp. 668-672 ◽  
Author(s):  
Robert O'Connor ◽  
Stephen McDonnell ◽  
Greg Hughes ◽  
Robin Degraeve ◽  
Thomas Kauerauf

1977 ◽  
Vol 3 (4) ◽  
pp. 233-246 ◽  
Author(s):  
J. Brettle ◽  
N. F. Jackson

The failure mechanism of solid tantalum and aluminium capacitors have been investigated using a combination of electrical measurements and electron microscopy. The capacitor dielectric was examined before and after life testing and changes correlated with electrical measurements.The basic mechanism of failure of solid tantalum capacitors is found to be field crystallisation of the essentially amorphous dielectric oxide. The growth of higher conductivity crystalline oxide during operation of the capacitors causes an increase in leakage current and may result in catastrophic failure. The effect of field crystallisation can be minimised by using high purity tantalum to reduce the number of crystallisation nucleation sites. Since crystalline growth is primarily dependant on applied voltage, high voltage capacitors are much more susceptible to failure than low voltage units.There appears to be no long term failure mechanism in solid aluminium capacitors. However, a particular problem with these units is that they are difficult to make. This is because the anodic layer is chemically less stable in the case of aluminium than in the case of tantalum. The attack is initiated during the deposition of manganese oxide by pyrolysis from manganese nitrate solution and developed by the reform process. Solid aluminium capacitors often have a lower capacitance and higher initial leakage current than comparable solid tantalum units; however, the leakage current decreases on life tests and their reliability is high.


2015 ◽  
Vol 107 (24) ◽  
pp. 244104 ◽  
Author(s):  
Alexandre Poulin ◽  
Samuel Rosset ◽  
Herbert R. Shea

2020 ◽  
Vol 1 (7(76)) ◽  
pp. 12-14
Author(s):  
O. P. Balashov

The article investigates the distribution of leakage current in low voltage wiring. The regression equation is obtained, which makes it possible to accurately predict the value of the leakage current of the electrical wiring supplying a group of power receivers with motor load.


In order to have efficient operation of grid connected Photovoltaic (PV) inverter, the issue of leakage current must be completely eliminated. For this new transformerless multilevel inverter is proposed in this paper with (k-1) levels in which k denotes the number of switches. The inverter provides zero common mode leakage current and also capable of operating under half of rated PV voltage, hence make this proposed inverter topology as LVRT (low voltage ride through) capable. Different modes are employed for the stable operation of the proposed inverter with varying input PV voltage. Simulation work is carried out for three, five and seven level proposed inverter topologies in MATLAB/Simulink software which determines its maximum power point tracking performance. Here the THD (Total Harmonic Distortions) of 3, 5 and 7 levels are compared.


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