High-resolution nondestructive testing of multilayer dielectric materials using wideband microwave synthetic aperture radar imaging

Author(s):  
Tae Hee Kim ◽  
Robin James ◽  
Ram M. Narayanan
2018 ◽  
Vol 91 (6) ◽  
pp. 673-683 ◽  
Author(s):  
Pei-Yun Tsai ◽  
Meng-Yuan Huang ◽  
Yu-Liang Tsai ◽  
Ching-Horng Lee ◽  
Li-Mei Chen ◽  
...  

2013 ◽  
Vol 101 (3) ◽  
pp. 759-783 ◽  
Author(s):  
Andreas Reigber ◽  
Rolf Scheiber ◽  
Marc Jager ◽  
Pau Prats-Iraola ◽  
Irena Hajnsek ◽  
...  

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