Laser beam focusing through the scattering medium by means of adaptive optics

2017 ◽  
Author(s):  
Ilya Galaktionov ◽  
Alexis Kudryashov ◽  
Julia Sheldakova ◽  
Alexander Nikitin
Keyword(s):  
Laser Beam ◽  
Adaptive Optics ◽  
Scattering Medium ◽  
Beam Focusing

Laser beam focusing through a moderately scattering medium using LCOS-SLM

2021 ◽  
Author(s):  
Ilya V. Galaktionov ◽  
Alexander Nikitin ◽  
Julia Sheldakova ◽  
Alexis Kudryashov
Keyword(s):  
Laser Beam ◽  
Scattering Medium ◽  
Beam Focusing

Comparison of the efficiency of laser beam focusing through the scattering medium using 14- and 31-channel bimorph mirrors

2018 ◽  
Author(s):  
Ilya Galaktionov ◽  
Alexis Kudryashov ◽  
Julia Sheldakova ◽  
Alexander Nikitin ◽  
Vadim Samarkin
Keyword(s):  
Laser Beam ◽  
Scattering Medium ◽  
Beam Focusing

Adaptive optics for laser-beam focusing through the pinhole

2019 ◽  
Author(s):  
Alexis V. Kudryashov ◽  
Alexander Nikitin ◽  
Ilya Galaktionov ◽  
Julia Sheldakova ◽  
Vadim Samarkin ◽  
...  
Keyword(s):  
Laser Beam ◽  
Adaptive Optics ◽  
Beam Focusing

scholarly journals Laser beam focusing through a moderately scattering medium using a bimorph mirror

2020 ◽  
Vol 28 (25) ◽  
pp. 38061
Author(s):  
Ilya Galaktionov ◽  
Julia Sheldakova ◽  
Alexander Nikitin ◽  
Vadim Samarkin ◽  
Vadim Parfenov ◽  
...  
Keyword(s):  
Laser Beam ◽  
Scattering Medium ◽  
Beam Focusing

Bimorph vs stacked actuator deformable mirror for laser beam focusing through a moderately scattering medium

2021 ◽  
Author(s):  
Ilya Galaktionov ◽  
Julia Sheldakova ◽  
Vladimir Toporovsky ◽  
Vadim Samarkin ◽  
Alexis Kudryashov
Keyword(s):  
Laser Beam ◽  
Deformable Mirror ◽  
Scattering Medium ◽  
Beam Focusing

Laser Failure Isolation Techniques Demonstrated On Test Structures

2008 ◽  
Author(s):  
Frank S. Arnold
Keyword(s):  
Integrated Circuits ◽  
Laser Beam ◽  
Case Studies ◽  
Induced Resistance ◽  
Simple Test ◽  
Resistance Change ◽  
Cross Sectional ◽  
Beam Focusing ◽  
Isolation Techniques ◽  
Heating Effects

Abstract To be better prepared to use laser based failure isolation techniques on field failures of complex integrated circuits, simple test structures without any failures can be used to study Optical Beam Induced Resistance Change (OBIRCH) results. In this article, four case studies are presented on the following test structures: metal strap, contact string, VIA string, and comb test structure. Several experiments were done to investigate why an OBIRCH image was seen in certain areas of a VIA string and not in others. One experiment showed the OBRICH variation was not related to the cooling and heating effects of the topology, or laser beam focusing. A 4 point probe resistance measurement and cross-sectional views correlated with the OBIRCH results and proved OBIRCH was able to detect a variation in VIA fabrication.

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