Stress-optic coefficients and temperature dependent refractive indices of potassium terbium fluoride (Conference Presentation)

2017 ◽  
Author(s):  
David E. Zelmon ◽  
Steven T. Fenstermaker ◽  
William B. Poston ◽  
John D. Kunkel ◽  
Kevin T. Stevens ◽  
...  
Keyword(s):  
Refractive Indices ◽  
Temperature Dependent

Order parameter and crossover temperature from temperature-dependent refractive indices for low birefringence liquid crystals

2017 ◽  
Vol 230 ◽  
pp. 280-289 ◽  
Author(s):  
Amid Ranjkesh ◽  
Jun-Chan Choi ◽  
Ji-Sub Park ◽  
Min-Kyu Park ◽  
Somaye Kiani ◽  
...  
Keyword(s):  
Liquid Crystals ◽  
Order Parameter ◽  
Refractive Indices ◽  
Crossover Temperature ◽  
Temperature Dependent

Emissivtty Studies on Polycrystalline Silicon and a-Si / SiO2 / Si

1997 ◽  
Vol 470 ◽  
Author(s):  
W. Chen ◽  
M. Oh ◽  
S. Abedrabbo ◽  
F. M. Tong ◽  
W. Schmidt ◽  
...  
Keyword(s):  
Experimental Data ◽  
Polycrystalline Silicon ◽  
Room Temperature ◽  
Experimental Studies ◽  
Radiative Properties ◽  
Refractive Indices ◽  
Silicon Substrates ◽  
Temperature Dependent ◽  
Open Environment ◽  
Single Side

ABSTRACTExperimental studies of the room temperature emissivity of polysilicon are reported here. These measurements have been performed using a spectral emissometer operating in the wavelength range of 0.8 – 20 μm. The measured optical properties are deconvolved to yield the wavelength dependent refractive indices and extinction coefficient of polysilicon. An in house developed computer program, OPCalc, is deployed to perform these calculations. Experimental results of the temperature dependent emissivity of a-Si / SiO2 / Si / SiO2 / a-Si, fabricated on single side polished silicon substrates, in the temperature range of 300 to 1100 K have been reported here. These measurements are performed for a-Si thickness of 2100A. Comparisons of the temperature dependent radiative properties of these structures between the front and the back show that the contribution of surface roughness to emissivity is negligible- The exposure of these a-Si coated structures to high temperatures in open environment has caused these surfaces to oxidize. Interpretations, have been sought by comparisons of the experimental data with those on SiO2 / Si structures.

scholarly journals Experimental Verification of Vuks Equation Using Hollow Prism Refractometer

2012 ◽  
Vol 2012 ◽  
pp. 1-6
Author(s):  
Anita Kanwar ◽  
Priya S. Yadav
Keyword(s):  
Liquid Crystal ◽  
Temperature Dependence ◽  
Experimental Verification ◽  
Cholesteric Liquid Crystal ◽  
Visible Range ◽  
Refractive Indices ◽  
Temperature Dependent ◽  
Crystalline Materials ◽  
Different Temperatures ◽  
Molecular Polarizabilities

The refractive indices of the cholesteric liquid crystal solution were measured using multiwavelength (visible range) refractometer for three different wavelengths. Measurements were made at different temperatures for various concentrations of the solution, mixing CLC in a soluble solvent. Vuks equation describes the wavelength and temperature dependence of refractive indices of anisotropic crystalline materials. We have used a simplified version of Vuks equation relating only to macroscopic indices and verified its validity for five-different-concentration solution at various temperatures. The result is also used to obtain molecular polarizabilities and temperature dependent material constants of our sample.

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