Structured illumination for 3D subdiffraction reconstruction of refractive-index and fluorescence (Conference Presentation)

2017 ◽  
Author(s):  
Shwetadwip Chowdhury ◽  
Joseph A. Izatt
Keyword(s):  
Refractive Index ◽  
Structured Illumination

scholarly journals Refractive index tomography with structured illumination

Optica ◽  
2017 ◽  
Vol 4 (5) ◽  
pp. 537 ◽  
Author(s):  
Shwetadwip Chowdhury ◽  
Will J. Eldridge ◽  
Adam Wax ◽  
Joseph Izatt
Keyword(s):  
Refractive Index ◽  
Structured Illumination

Culturing Cells on Flexible Substrates of High Refractive Indexes

2012 ◽  
Vol 1418 ◽  
Author(s):  
You-Ren Liu ◽  
Po-Ling Kuo
Keyword(s):  
Refractive Index ◽  
Cell Adhesion ◽  
Phase Contrast ◽  
Human Lung ◽  
Structured Illumination ◽  
Adenocarcinoma Cells ◽  
Human Lung Adenocarcinoma Cells ◽  
Cellular Behaviors ◽  
Phase Contrast Tomography ◽  
Composite Substrates

ABSTRACTMechanical cues in cellular microenvironment are central in directing a class of cellular behaviors such as the dynamic of cell adhesion, migration, and differentiation. Several advanced optical techniques, such as structured-illumination nano-profilometry (SINAP), have been developed for a better resolution of these dynamic processes. These techniques however require culturing cells on materials of refractive index close to that of glass, while most studies regarding the effects of mechanical cues on cellular dynamics were conducted on hydrogel-based substrates. Here we report the development of culturing substrates of tunable rigidity and refractive index suitable for SINAP studies. Polyvinyl chloride (PVC)-based substrates were mixed with a softener called Di(isononyl) Cyclohexane-1,2-Dicarboxylate (DINCH) and cured by heating. The volume ratios of PVC to DINCH were varied from 1:1 to 3:1. The Young’s modulus of the resulting substrates ranged from 18 kPa to 40 kPa. The yielded refractive indices of the composite substrates as measured by phase contrast tomography ranged from 1.47 to 1.53. Human lung adenocarcinoma cells CL1-5 were cultured on the composite substrates and cell viability was examined using the MTT assay. The dynamics of cell adhesion and filopodia activities were examined using SINAP. Preliminary results suggest that PVC based culturing substrates have a great potential in the application of SINAP based studies.

scholarly journals Structured illumination microscopy artifacts caused by illumination scattering

2021 ◽  
Author(s):  
Yanquan Mo ◽  
Fan Feng ◽  
Heng Mao ◽  
Junchao Fan ◽  
Liangyi Chen
Keyword(s):  
Refractive Index ◽  
Incident Light ◽  
Super Resolution ◽  
Optical Path ◽  
Sample Thickness ◽  
Structured Illumination ◽  
Structured Illumination Microscopy ◽  
Subcellular Structure ◽  
Excitation Light ◽  
Noise Amplification

AbstractDespite its wide application in live-cell super-resolution (SR) imaging, structured illumination microscopy (SIM) suffers from aberrations caused by various sources. Although artifacts generated from inaccurate reconstruction parameter estimation and noise amplification can be minimized, aberrations due to the scattering of excitation light on samples have rarely been investigated. In this paper, by simulating multiple subcellular structure with the distinct refractive index (RI) from water, we study how different thicknesses of this subcellular structure scatter incident light on its optical path of SIM excitation. Because aberrant interference light aggravates with the increase in sample thickness, the reconstruction of the 2D-SIM SR image degraded with the change of focus along the axial axis. Therefore, this work may guide the future development of algorithms to suppress SIM artifacts caused by scattering in thick samples.

scholarly journals Structured illumination microscopy artefacts caused by illumination scattering

2021 ◽  
Vol 379 (2199) ◽  
Author(s):  
Yanquan Mo ◽  
Fan Feng ◽  
Heng Mao ◽  
Junchao Fan ◽  
Liangyi Chen
Keyword(s):  
Refractive Index ◽  
Incident Light ◽  
Super Resolution ◽  
Optical Path ◽  
Sample Thickness ◽  
Structured Illumination ◽  
Structured Illumination Microscopy ◽  
Subcellular Structure ◽  
Excitation Light ◽  
Noise Amplification

Despite its wide application in live-cell super-resolution (SR) imaging, structured illumination microscopy (SIM) suffers from aberrations caused by various sources. Although artefacts generated from inaccurate reconstruction parameter estimation and noise amplification can be minimized, aberrations due to the scattering of excitation light on samples have rarely been investigated. In this paper, by simulating multiple subcellular structure with the distinct refractive index from water, we study how different thicknesses of this subcellular structure scatter incident light on its optical path of SIM excitation. Because aberrant interference light aggravates with the increase in sample thickness, the reconstruction of the 2D-SIM SR image degraded with the change of focus along the axial axis. Therefore, this work may guide the future development of algorithms to suppress SIM artefacts caused by scattering in thick samples. This article is part of the Theo Murphy meeting issue ‘Super-resolution structured illumination microscopy (part 1)'.

TEM characterization of proton-exchanged LiNbO3 optical waveguides

1986 ◽  
Vol 44 ◽  
pp. 480-481
Author(s):  
W. E. Lee
Keyword(s):  
Refractive Index ◽  
Benzoic Acid ◽  
Optical Waveguides ◽  
Total Internal Reflection ◽  
Index Of Refraction ◽  
Optical Measurements ◽  
Lithium Ions ◽  
Wide Channel ◽  
Tem Characterization

An optical waveguide consists of a several-micron wide channel with a slightly different index of refraction than the host substrate; light can be trapped in the channel by total internal reflection.Optical waveguides can be formed from single-crystal LiNbO3 using the proton exhange technique. In this technique, polished specimens are masked with polycrystal1ine chromium in such a way as to leave 3-13 μm wide channels. These are held in benzoic acid at 249°C for 5 minutes allowing protons to exchange for lithium ions within the channels causing an increase in the refractive index of the channel and creating the waveguide. Unfortunately, optical measurements often reveal a loss in waveguiding ability up to several weeks after exchange.

Light microscopy of ceramics

1993 ◽  
Vol 51 ◽  
pp. 908-909
Author(s):  
Walter C. McCrone
Keyword(s):  
Refractive Index ◽  
Light Microscopy ◽  
Light Microscope ◽  
Polarized Light ◽  
Refractive Indices ◽  
Complete Coverage ◽  
The Subject ◽  
Lower Refractive Index

An excellent chapter on this subject by V.D. Fréchette appeared in a book edited by L.L. Hench and R.W. Gould in 1971 (1). That chapter with the references cited there provides a very complete coverage of the subject. I will add a more complete coverage of an important polarized light microscope (PLM) technique developed more recently (2). Dispersion staining is based on refractive index and its variation with wavelength (dispersion of index). A particle of, say almandite, a garnet, has refractive indices of nF = 1.789 nm, nD = 1.780 nm and nC = 1.775 nm. A Cargille refractive index liquid having nD = 1.780 nm will have nF = 1.810 and nC = 1.768 nm. Almandite grains will disappear in that liquid when observed with a beam of 589 nm light (D-line), but it will have a lower refractive index than that liquid with 486 nm light (F-line), and a higher index than that liquid with 656 nm light (C-line).

Sign in / Sign up

Export Citation Format

Share Document