Resolution enhancement down to 10-nm based on saturated excitation (SAX) microscopy plus novel nonlinear response (Conference Presentation)

Author(s):  
Hou-Xian Ding ◽  
Kuan-Yu Li ◽  
Gitanjal Deka ◽  
I-Cheng Su ◽  
Shi-Wei Chu
Author(s):  
J.K. Weiss ◽  
M. Gajdardziska-Josifovska ◽  
M. R. McCartney ◽  
David J. Smith

Interfacial structure is a controlling parameter in the behavior of many materials. Electron microscopy methods are widely used for characterizing such features as interface abruptness and chemical segregation at interfaces. The problem for high resolution microscopy is to establish optimum imaging conditions for extracting this information. We have found that off-axis electron holography can provide useful information for the study of interfaces that is not easily obtained by other techniques.Electron holography permits the recovery of both the amplitude and the phase of the image wave. Recent studies have applied the information obtained from electron holograms to characterizing magnetic and electric fields in materials and also to atomic-scale resolution enhancement. The phase of an electron wave passing through a specimen is shifted by an amount which is proportional to the product of the specimen thickness and the projected electrostatic potential (ignoring magnetic fields and diffraction effects). If atomic-scale variations are ignored, the potential in the specimen is described by the mean inner potential, a bulk property sensitive to both composition and structure. For the study of interfaces, the specimen thickness is assumed to be approximately constant across the interface, so that the phase of the image wave will give a picture of mean inner potential across the interface.


AIAA Journal ◽  
2000 ◽  
Vol 38 ◽  
pp. 1543-1557 ◽  
Author(s):  
Deman Tang ◽  
Denis Kholodar ◽  
Earl H. Dowell

AIAA Journal ◽  
2001 ◽  
Vol 39 ◽  
pp. 962-965
Author(s):  
Abdulmuhsen H. Ali

2019 ◽  
Author(s):  
Ingo Strenge ◽  
Carsten Engelhard

<p>The article demonstrates the importance of using a suitable approach to compensate for dead time relate count losses (a certain measurement artefact) whenever short, but potentially strong transient signals are to be analysed using inductively coupled plasma mass spectrometry (ICP-MS). Findings strongly support the theory that inadequate time resolution, and therefore insufficient compensation for these count losses, is one of the main reasons for size underestimation observed when analysing inorganic nanoparticles using ICP-MS, a topic still controversially discussed.</p>


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