On-chip near field fluorescence excitation and detection with nanophotonic waveguides for enhanced surface sensitivity (Conference Presentation)

Author(s):  
Md. Mahmud-Ul-Hasan ◽  
Pieter Neutens ◽  
Liesbet Lagae ◽  
Pol Van Dorpe
1999 ◽  
Vol 589 ◽  
Author(s):  
Jingyue Liu

AbstractThe use of a high-brightness field emission gun and novel secondary electron detection systems makes it possible to acquire nanometer-resolution surface images of bulk materials, even at low electron beam voltages. The advantages of low-voltage SEM include enhanced surface sensitivity, reduced sample charging on non-conducting materials, and significantly reduced electron range and interaction volume. High-resolution images formed by collecting the backscattered electron signal can give information about the size and spatial distribution of metal nanoparticles in supported catalysts. Low-voltage XEDS can provide compositional information of bulk samples with enhanced surface sensitivity and significantly improved spatial resolution. High-resolution SEM techniques enhance our ability to detect and, subsequently, analyze the composition of nanoparticles in supported metal catalysts. Applications of high-resolution SEM imaging and microanalysis techniques to the study of industrial supported catalysts are discussed.


2021 ◽  
Vol 10 (1) ◽  
Author(s):  
Yoel Sebbag ◽  
Eliran Talker ◽  
Alex Naiman ◽  
Yefim Barash ◽  
Uriel Levy

AbstractRecently, there has been growing interest in the miniaturization and integration of atomic-based quantum technologies. In addition to the obvious advantages brought by such integration in facilitating mass production, reducing the footprint, and reducing the cost, the flexibility offered by on-chip integration enables the development of new concepts and capabilities. In particular, recent advanced techniques based on computer-assisted optimization algorithms enable the development of newly engineered photonic structures with unconventional functionalities. Taking this concept further, we hereby demonstrate the design, fabrication, and experimental characterization of an integrated nanophotonic-atomic chip magnetometer based on alkali vapor with a micrometer-scale spatial resolution and a magnetic sensitivity of 700 pT/√Hz. The presented platform paves the way for future applications using integrated photonic–atomic chips, including high-spatial-resolution magnetometry, near-field vectorial imaging, magnetically induced switching, and optical isolation.


2021 ◽  
Vol 10 (1) ◽  
Author(s):  
Sonakshi Arora ◽  
Thomas Bauer ◽  
René Barczyk ◽  
Ewold Verhagen ◽  
L. Kuipers

AbstractTopological on-chip photonics based on tailored photonic crystals (PhCs) that emulate quantum valley-Hall effects has recently gained widespread interest owing to its promise of robust unidirectional transport of classical and quantum information. We present a direct quantitative evaluation of topological photonic edge eigenstates and their transport properties in the telecom wavelength range using phase-resolved near-field optical microscopy. Experimentally visualizing the detailed sub-wavelength structure of these modes propagating along the interface between two topologically non-trivial mirror-symmetric lattices allows us to map their dispersion relation and differentiate between the contributions of several higher-order Bloch harmonics. Selective probing of forward- and backward-propagating modes as defined by their phase velocities enables direct quantification of topological robustness. Studying near-field propagation in controlled defects allows us to extract upper limits of topological protection in on-chip photonic systems in comparison with conventional PhC waveguides. We find that protected edge states are two orders of magnitude more robust than modes of conventional PhC waveguides. This direct experimental quantification of topological robustness comprises a crucial step toward the application of topologically protected guiding in integrated photonics, allowing for unprecedented error-free photonic quantum networks.


Author(s):  
Dmitry S. Bulgarevich ◽  
Yusuke Akamine ◽  
Hideaki Kitahara ◽  
Valynn Katrine P. Mag-Usara ◽  
Hiroyuki Kato ◽  
...  

Author(s):  
C. Husko ◽  
M. Wulf ◽  
S. Combrie ◽  
A. De Rossi ◽  
L. Kuipers ◽  
...  

2010 ◽  
Vol 81 (9) ◽  
pp. 093707 ◽  
Author(s):  
J. Hayton ◽  
J. Polesel-Maris ◽  
R. Demadrille ◽  
M. Brun ◽  
F. Thoyer ◽  
...  

2010 ◽  
Vol 18 (6) ◽  
pp. 6396 ◽  
Author(s):  
P. C. Ashok ◽  
R. F. Marchington ◽  
P. Mthunzi ◽  
T. F. Krauss ◽  
K. Dholakia

2013 ◽  
Vol 2 (1) ◽  
Author(s):  
Yingying Zhao ◽  
Qin Li ◽  
Xiao-Ming Hu ◽  
Dong-Fang Yang

AbstractThe power density of optical excitation on microfluidic chips is attenuated due to the beam divergence of the optical fiber, making it difficult to collect either the emission or scattering light. The excitation power and coupling efficiency can be significantly increased by using an on-chip microlens system with integrated optical fibers, specially designed and simulated to reshape and collect the optical signal within the microfluidic chip.This article presents research work for designing, fabricating, and testing a type of on-chip microlens. The on-chip microlens was designed by Code VThe export light beam could be focused to a very small point to satisfy the requirements of the fluorescence excitation of samples. On the other hand, the detection efficiency could also be increased with the help of the on-chip microlens. The presented fabrication method does not require any assembly process or external driving force. To fabricate a microlens with a different focus, it is only necessary to change the figures on the mask. This technique can be used in a variety of applications as it is possible to produce customized microlens for specific applications.


Sign in / Sign up

Export Citation Format

Share Document