scholarly journals Quantitative characterization of aberrations in x-ray optics

Author(s):  
Frank Seiboth ◽  
Maik Kahnt ◽  
Maria Scholz ◽  
Martin Seyrich ◽  
Felix Wittwer ◽  
...  
Author(s):  
Claudio Ferrari ◽  
Riccardo Lolli ◽  
Bianca Salmaso ◽  
Giovanni Pareschi ◽  
Gianpiero Tagliaferri ◽  
...  
Keyword(s):  
X Ray ◽  

2017 ◽  
Vol 24 (1) ◽  
pp. 110-141 ◽  
Author(s):  
Andrew W. Stevenson ◽  
Jeffrey C. Crosbie ◽  
Christopher J. Hall ◽  
Daniel Häusermann ◽  
Jayde Livingstone ◽  
...  

A critical early phase for any synchrotron beamline involves detailed testing, characterization and commissioning; this is especially true of a beamline as ambitious and complex as the Imaging & Medical Beamline (IMBL) at the Australian Synchrotron. IMBL staff and expert users have been performing precise experiments aimed at quantitative characterization of the primary polychromatic and monochromatic X-ray beams, with particular emphasis placed on the wiggler insertion devices (IDs), the primary-slit system and any in vacuo and ex vacuo filters. The findings from these studies will be described herein. These results will benefit IMBL and other users in the future, especially those for whom detailed knowledge of the X-ray beam spectrum (or `quality') and flux density is important. This information is critical for radiotherapy and radiobiology users, who ultimately need to know (to better than 5%) what X-ray dose or dose rate is being delivered to their samples. Various correction factors associated with ionization-chamber (IC) dosimetry have been accounted for, e.g. ion recombination, electron-loss effects. A new and innovative approach has been developed in this regard, which can provide confirmation of key parameter values such as the magnetic field in the wiggler and the effective thickness of key filters. IMBL commenced operation in December 2008 with an Advanced Photon Source (APS) wiggler as the (interim) ID. A superconducting multi-pole wiggler was installed and operational in January 2013. Results are obtained for both of these IDs and useful comparisons are made. A comprehensive model of the IMBL has been developed, embodied in a new computer program named spec.exe, which has been validated against a variety of experimental measurements. Having demonstrated the reliability and robustness of the model, it is then possible to use it in a practical and predictive manner. It is hoped that spec.exe will prove to be a useful resource for synchrotron science in general, and for hard X-ray beamlines, whether they are based on bending magnets or insertion devices, in particular. In due course, it is planned to make spec.exe freely available to other synchrotron scientists.


2020 ◽  
Vol 50 (1) ◽  
pp. 53-67
Author(s):  
Fabio L. Melquiades ◽  
Sandro V. Santos ◽  
Fabio Lopes ◽  
Juan Villanueva ◽  
Jorge L. Ticona ◽  
...  

Langmuir ◽  
2019 ◽  
Vol 35 (35) ◽  
pp. 11315-11321
Author(s):  
Christin Buechner ◽  
Sabrina M. Gericke ◽  
Lena Trotochaud ◽  
Osman Karslıoǧlu ◽  
Joseph Raso ◽  
...  

2016 ◽  
Vol 41 (2) ◽  
pp. 281 ◽  
Author(s):  
Istvan Mohacsi ◽  
Ismo Vartiainen ◽  
Manuel Guizar-Sicairos ◽  
Petri Karvinen ◽  
Vitaliy A. Guzenko ◽  
...  

2002 ◽  
Vol 31 (6) ◽  
pp. 448-450 ◽  
Author(s):  
M. Chukalina ◽  
A. Simionovici ◽  
A. Snigirev ◽  
T. Jeffries

1989 ◽  
Vol 160 ◽  
Author(s):  
David D. Allred ◽  
Qi Wang ◽  
Jesus Gonzalez-Hernandez

AbstractLaser Raman spectroscopy has been found to be useful for characterizing amorphous semiconductor multilayers, especially the interfaces of multilayers. Recently, we have extended this technique to the characterization of magnetron sputtered multilayers commonly used as reflectors in soft x-ray optics. Unlike the multilayers previously studied which contained only semiconductors and dielectrics, these are generally semiconductor/metal multilayers. We report here on the Raman characterization of the most common class of multilayers used in soft x-ray optics, those that contain a high density metal like tungsten interspersed with layers of carbon. In all of the metal/carbon multilayers the dominate feature in the Raman spectra is due to a-C. The a-C spectra consists of a broad peak at about 1560 cm-1 (G-peak) and a shoulder at about 1400 cm-1 (D-peak). This can be deconvoluted with Gaussian line shapes to yield two peaks (one at about 1560 to 1570 cm-1 and the other at about 1380 to 1420 cm-1). Among the W/C multilayer samples peak positions and relative magnitudes changed little with carbon thickness over the range of 1 to 12 nm. Significant differences are, however, seen as the identity of the metal component is altered or, especially, as the preparations are varied. For example, the intensity ratio of the D-peak to G-peak was much larger for multilayer samples prepared under conditions of good plasma confinement.


Sign in / Sign up

Export Citation Format

Share Document