Identification of superficial defects in reconstructed 3D objects using phase-shifting fringe projection

2016 ◽  
Author(s):  
Carlos A. Madrigal ◽  
Alejandro Restrepo ◽  
John W. Branch
Keyword(s):  
Phase Shifting ◽  
Fringe Projection ◽  
3D Objects

The Membrane Thickness Prediction of Solder Paste Process by Phase-Shifting Projection

2013 ◽  
Vol 284-287 ◽  
pp. 550-556 ◽  
Author(s):  
Yu Fang Chung ◽  
Kun Lin Tsai ◽  
Tzer Long Chen ◽  
Yen Chu Hsu ◽  
Yi Hsuan Yu
Keyword(s):  
Projection Method ◽  
Phase Shifting ◽  
Fringe Projection ◽  
Membrane Thickness ◽  
Solder Paste ◽  
3D Image ◽  
Electronic Products ◽  
Optical Grating ◽  
Surface Image ◽  
Thickness Prediction

Electronic products have become lighter and thinner nowadays. SMT includes three basic steps, namely solder paste print, electronic component adhesion and reflow[1]. This research tends to capture the image of fringe projection based on CCD with optical grating and reconstruct the 3D surface image of solder paste use triangulation measurement. The main ideal is using fringe projection method to observe the distortion of the fringe phenomenon caused by different heights of the surface. Last, the depth of the surface is computed under test variation and the 3D image is reconstructed.

Shape defect measurement by fringe projection profilometry and phase-shifting algorithms

2020 ◽  
Vol 59 (01) ◽  
pp. 1
Author(s):  
Sotero Ordoñes Nogales ◽  
Manuel Servin ◽  
Moises Padilla ◽  
Ivan Choque ◽  
Jorge L. Flores Nuñez ◽  
...  
Keyword(s):  
Phase Shifting ◽  
Fringe Projection ◽  
Fringe Projection Profilometry

Active phase error suppression for color phase-shifting fringe projection based on hue pre-correction

2019 ◽  
Vol 118 ◽  
pp. 102-108 ◽  
Author(s):  
Yingying Wan ◽  
Yiping Cao ◽  
Cheng Chen ◽  
Yapin Wang ◽  
Guangkai Fu ◽  
...  
Keyword(s):  
Phase Error ◽  
Active Phase ◽  
Phase Shifting ◽  
Fringe Projection ◽  
Error Suppression

3D shape measurement system based on fringe projection in 4-step phase shifting

2015 ◽  
Vol 36 (4) ◽  
pp. 584-589 ◽  
Author(s):  
Shang Zhong-yi ◽  
Li Wei-xian ◽  
Dong Ming-li ◽  
Duan Liang-jun
Keyword(s):  
Measurement System ◽  
Phase Shifting ◽  
Fringe Projection ◽  
Shape Measurement ◽  
3D Shape ◽  
3D Shape Measurement

A New Three-Dimensional Profilometer for Surface Profile Measurement Using Digital Fringe Projection and Phase Shifting

2005 ◽  
Vol 295-296 ◽  
pp. 471-476
Author(s):  
Liang Chia Chen ◽  
S.H. Tsai ◽  
Kuang Chao Fan
Keyword(s):  
High Speed ◽  
Structured Light ◽  
Three Dimensional ◽  
Surface Profile ◽  
Phase Shifting ◽  
Fringe Projection ◽  
Surface Measurement ◽  
Profile Measurement ◽  
Digital Fringe Projection ◽  
Fringe Patterns

The development of a three-dimensional surface profilometer using digital fringe projection technology and phase-shifting principle is presented. Accurate and high-speed three-dimensional profile measurement plays a key role in determining the success of process automation and productivity. By integrating a digital micromirror device (DMD) with the developed system, exclusive advantages in projecting flexible and accurate structured-light patterns onto the object surface to be measured can be obtained. Furthermore, the developed system consists of a specially designed micro-projecting optical unit for generating flexibly optimal structured-light to accommodate requirements in terms of measurement range and resolution. Its wide angle image detection design also improves measurement resolution for detecting deformed fringe patterns. This resolves the problem in capturing effective deformed fringe patterns for phase shifting, especially when a coaxial optical layout of a stereomicroscope is employed. Experimental results verified that the maximum error was within a reasonable range of the measured depth. The developed system and the method can provide a useful and effective tool for 3D full field surface measurement ranging from µm up to cm scale.

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