Oblique incidence of semi-guided waves on step-like folds in planar dielectric slabs: Lossless vertical interconnects in 3D integrated photonic circuits

2016 ◽  
Author(s):  
Andre Hildebrandt ◽  
Samer Alhaddad ◽  
Manfred Hammer ◽  
Jens Förstner
Keyword(s):  
Oblique Incidence ◽  
Guided Waves ◽  
Photonic Circuits ◽  
Vertical Interconnects

scholarly journals Coupled microstrip-cavities under oblique incidence of semi-guided waves: a lossless integrated optical add-drop filter

OSA Continuum ◽  
2019 ◽  
Vol 2 (11) ◽  
pp. 3288 ◽  
Author(s):  
Lena Ebers ◽  
Manfred Hammer ◽  
Manuel B. Berkemeier ◽  
Alexander Menzel ◽  
Jens Förstner
Keyword(s):  
Oblique Incidence ◽  
Guided Waves ◽  
Integrated Optical

Scattering Rings in Birefringent Porous Silicon

2003 ◽  
Vol 762 ◽  
Author(s):  
Claudio J. Oton ◽  
Zeno Gaburro ◽  
Mher Ghulinyan ◽  
Nicola Daldosso ◽  
Lucio Pancheri ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Light Scattering ◽  
Porous Silicon ◽  
Direct Measurement ◽  
Optical Anisotropy ◽  
Oblique Incidence ◽  
Laser Light ◽  
Anisotropic Scattering ◽  
Scattering Measurements

AbstractWe report the observation of strongly anisotropic scattering of laser light at oblique incidence on (100)-oriented porous silicon layers. We performed angle-resolved light scattering measurements and three concentric rings were observed. Modeling porous silicon by means of nanometric columnar air pores and an effective anisotropic uniaxial dielectric constant explains the observed phenomenon, and besides, the observation of the angle aperture of these rings allows a direct measurement of relative birefringence. We finally study the changes of optical anisotropy after different modifications of the structure.

Pb Electrodeposition in the Presence of Chlorine Ions on Cu(100): An in Situ Optical Reflectivity Difference Study

2003 ◽  
Vol 781 ◽  
Author(s):  
J. Gray ◽  
W. Schwarzacher ◽  
X.D. Zhu
Keyword(s):  
Oblique Incidence ◽  
Opposite Sign ◽  
Bulk Phase ◽  
Phase Layer ◽  
Optical Reflectivity ◽  
Scan Rate ◽  
Different Types ◽  
Chlorine Ions ◽  
High Overpotentials

AbstractWe studied the initial stages of the electrodeposition of Pb in the presence of chlorine ions on Cu(100), using an oblique-incidence optical reflectivity difference (OIRD) technique. The OI-RD results reveal that immediately following the underpotential deposition (UPD) of the first Pb monolayer, two different types of bulk-phase films grow depending upon the magnitude of overpotential and cyclic voltammetry (CV) scan rate. At low overpotentials and/or slow scan rates, we propose that a bulk-phase Pb film grows on top of the UPD monolayer. At high overpotentials and/or fast scan rates, either a PbO, PbCl2, or a rough Pb bulk-phase layer grows on top of the UPD layer such that the reflectivity difference signal from such a film has an opposite sign.

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