Space camera optical axis pointing precision measurement system

2016 ◽  
Author(s):  
Gang Chen ◽  
Fanbo Meng ◽  
Zijun Yang ◽  
Yubo Guo ◽  
Dong Ye
2020 ◽  
Vol 238 ◽  
pp. 06011
Author(s):  
Jan Spichtinger ◽  
Michael Schulz ◽  
Gerd Ehret

We are developing a form measurement system for the surfaces of freeform optics and large conventional optics. The specifications of the optics are diameters up to 1.5 m and radii of curvature down to 10 m. This includes optics like telescope mirror segments and synchrotron optics. Using a Fizeau interferometer, we propose a subaperture stitching method that involves vertically aligning the interferometer’s optical axis to the local surface gradient and measuring the absolute distance from the interferometer’s reference flat to the specimen. Experimental results for the absolute distance measurement are shown.


2008 ◽  
Vol 44 (5-6) ◽  
pp. 539-547 ◽  
Author(s):  
Neville K. S. Lee ◽  
Jacky K. H. Chow ◽  
Albert C. K. Chan

2012 ◽  
Vol 562-564 ◽  
pp. 2157-2162
Author(s):  
Bai Tong He ◽  
Jian Liang Xu

Based on research of the traditional phase-shifting profilometry (PSP) method, a tilted measurement system is proposed. The proposed technology makes three constraints of the traditional phase-shifting profilometry measurement system less constrains. The exit pupil of the projecting system and the entrance pupil of the CCD imaging system are not horizontal and not placed at equal height. The optical axis in the CCD imaging system is not necessarily perpendicular with a specific tilting angle to the reference plane. The optical axises of the CCD imaging system and projecting system are not coplanar. The two axises do not intersect with each other. Compared to the traditional phase-shifting profilometry the proposed method offers a flexible way to calculate height distribution.


2005 ◽  
Vol 2005.40 (0) ◽  
pp. 142-143
Author(s):  
Masayuki TAKESHIMA ◽  
Masaru FURUKAWA ◽  
Wei GAO ◽  
Hiroki SHIMIZU ◽  
Satoshi KIYONO

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