Influence of substrate refractive index and metallic structure size on resonant properties in terahertz split ring resonators

2015 ◽  
Author(s):  
Zhou Yang ◽  
Yulei Shi ◽  
Wei Wang ◽  
Qingli Zhou ◽  
Chenyu Li ◽  
...  
Keyword(s):  
Refractive Index ◽  
Ring Resonators ◽  
Metallic Structure ◽  
Split Ring ◽  
Split Ring Resonators ◽  
Influence Of Substrate

scholarly journals Chiral metamaterials with negative refractive index based on four “U” split ring resonators

2010 ◽  
Vol 97 (8) ◽  
pp. 081901 ◽  
Author(s):  
Zhaofeng Li ◽  
Rongkuo Zhao ◽  
Thomas Koschny ◽  
Maria Kafesaki ◽  
Kamil Boratay Alici ◽  
...  
Keyword(s):  
Refractive Index ◽  
Negative Refractive Index ◽  
Ring Resonators ◽  
Split Ring ◽  
Split Ring Resonators ◽  
Chiral Metamaterials

scholarly journals Nanofabrication of planar split ring resonators for negative refractive index metamaterials in the infrared range

2006 ◽  
Vol 71 (6) ◽  
pp. 695-703 ◽  
Author(s):  
Zoran Jaksic ◽  
Dana Vasiljevic-Radovic ◽  
Milan Maksimovic ◽  
Milija Sarajlic ◽  
Zoran Djuric
Keyword(s):  
Refractive Index ◽  
Negative Refractive Index ◽  
Building Blocks ◽  
Ring Resonators ◽  
Infrared Range ◽  
Process Conditions ◽  
Split Ring ◽  
Crystal Silicon ◽  
Split Ring Resonators ◽  
Positive Photoresist

Experimental nanofabrication of planar structures for one-dimensional metamaterials designed to achieve a negative effective refractive index in the mid-infrared range (5-10 micrometers) was performed. Double split ring and complementary double split ring resonators (SRR and CSRR) with square and circular geometries, were chosen to be fabricated since these are the basic building blocks to achieve a negative effective dielectric permittivity and magnetic permeability. Scanning probe nanolithography with z-scanner movement was used to fabricate straight-line and curvilinear segments with a line width of 80-120 nm. The geometries were delineated in 20 nm thin silver layers sputter-deposited on a positive photoresist substrate spin-coated on polished single crystal silicon wafers, as well as on polycarbonate slabs. The morphology of the structures was characterized by atomic force microscopy. The feature repeatibility was 60-150 nm, depending on the process conditions and the feature complexity. The nanolithographic groove depth in different samples ranged from 4 nm to 80 nm.

EFFECT OF DEFECT WIRES AND SPLIT RING RESONATORS ON MICROWAVE RESPONSE

2008 ◽  
Vol 22 (05) ◽  
pp. 547-551
Author(s):  
YU FENG ◽  
JIAN-PING SONG ◽  
JIAN WU
Keyword(s):  
Refractive Index ◽  
Resonant Frequency ◽  
Negative Refractive Index ◽  
Ring Resonators ◽  
Pass Band ◽  
Microwave Response ◽  
Split Ring ◽  
Split Ring Resonators

The effect of defect introduced in wires and split ring resonators (SRRs) on the pass band and resonant frequency is investigated. The results show that there exists a shift for resonant frequency and a narrow pass band deduced by the introduction of defect into negative refractive index materials, the defect SRR affects the nonlinear microwave response significantly.

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