Investigation of magnetically smart films applied to correct the surface profile of light weight X-ray optics in two directions

2015 ◽  
Author(s):  
Xiaoli Wang ◽  
Youwei Yao ◽  
Jian Cao ◽  
Semyon Vaynman ◽  
Michael E. Graham ◽  
...  
Keyword(s):  
Surface Profile ◽  
Light Weight ◽  
Ray Optics ◽  
X Ray

scholarly journals Next generation astronomical x-ray optics: high angular resolution, light weight, and low production cost

2012 ◽  
Author(s):  
W. W. Zhang ◽  
M. P. Biskach ◽  
P. N. Blake ◽  
K.-W. Chan ◽  
J. A. Gaskin ◽  
...  
Keyword(s):  
Production Cost ◽  
Angular Resolution ◽  
High Angular Resolution ◽  
Light Weight ◽  
Next Generation ◽  
Ray Optics ◽  
X Ray

Cold shaping of thin glass foils: a fast and cost-effective solution for making light-weight astronomical x-ray optics

2015 ◽  
Author(s):  
M. M. Civitani ◽  
S. Basso ◽  
O. Citterio ◽  
M. Ghigo ◽  
B. Salmaso ◽  
...  
Keyword(s):  
Cost Effective ◽  
Light Weight ◽  
Effective Solution ◽  
Ray Optics ◽  
Thin Glass ◽  
X Ray

Alternative materials in view of new light weight x-ray optics

2009 ◽  
Author(s):  
M. Skulinova ◽  
R. Hudec ◽  
J. Sik ◽  
M. Lorenc ◽  
L. Pina ◽  
...  
Keyword(s):  
Light Weight ◽  
Ray Optics ◽  
X Ray ◽  
Alternative Materials

scholarly journals Astronomical x-ray optics using mono-crystalline silicon: high resolution, light weight, and low cost

2018 ◽  
Author(s):  
William W. Zhang ◽  
Kim D. Allgood ◽  
Michael P. Biskach ◽  
Michal Hlinka ◽  
Peter M. Solly ◽  
...  
Keyword(s):  
High Resolution ◽  
Crystalline Silicon ◽  
Low Cost ◽  
Light Weight ◽  
Ray Optics ◽  
X Ray

Development of light weight replicated x-ray optics, II

2014 ◽  
Author(s):  
S. Romaine ◽  
R. Bruni ◽  
B. Choi ◽  
C. Jensen ◽  
K. Kilaru ◽  
...  
Keyword(s):  
Light Weight ◽  
Ray Optics ◽  
X Ray

Development of high-resolution and light-weight x-ray optics with deformed silicon wafers

2009 ◽  
Author(s):  
Yuichiro Ezoe ◽  
Takayuki Shirata ◽  
Takaya Ohashi ◽  
Manabu Ishida ◽  
Kazuhisa Mitsuda ◽  
...  
Keyword(s):  
High Resolution ◽  
Silicon Wafers ◽  
Light Weight ◽  
Ray Optics ◽  
X Ray

Development of light weight replicated x-ray optics

2013 ◽  
Author(s):  
S. Romaine ◽  
R. Bruni ◽  
B. Choi ◽  
P. Gorenstein ◽  
C. Jensen ◽  
...  
Keyword(s):  
Light Weight ◽  
Ray Optics ◽  
X Ray

X-ray microprobe for materials science

1994 ◽  
Vol 52 ◽  
pp. 56-57
Author(s):  
G.E. Ice
Keyword(s):  
Crystallographic Orientation ◽  
Local Structure ◽  
Materials Science ◽  
Chemical Information ◽  
X Ray Diffraction ◽  
Ray Optics ◽  
X Ray ◽  
Novel Materials ◽  
New Information ◽  
Elemental Sensitivity

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.

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