Evaluation of surface and bulk qualities of semiconductor materials by a laser-induced photothermal technique

2015 ◽  
Author(s):  
Jingtao Dong ◽  
Jian Chen ◽  
Shiwen Sun ◽  
Dawei Zhang ◽  
Songlin Zhuang ◽  
...  
Keyword(s):  
Semiconductor Materials ◽  
Photothermal Technique

INTERFEROMETRIC MEASUREMENTES OF PHOTOTHERMAL DEFLECTION

2001 ◽  
Vol 15 (17n19) ◽  
pp. 613-616 ◽  
Author(s):  
E. CORONA-ORGANICHE ◽  
E. LOPEZ-CRUZ
Keyword(s):  
Thermal Diffusivity ◽  
Semiconductor Materials ◽  
Dimensional Model ◽  
Thick Sample ◽  
One Dimensional ◽  
Photothermal Technique ◽  
Diffusivity Measurements ◽  
Photothermal Deflection

The photothermal technique has been applied for the thermal diffusivity measurements. These measurements based on interferometric photothermal deflection effect were made on ZnxCd1-x Te (x = 5%, 10% and 20%). A simple one-dimensional model is presented to obtain the thermal diffusivity for semiconductor materials in the case of a thermally thick sample that is optically opaque.

Cathodoluminescence of Catalyst Crystallites

1982 ◽  
Vol 40 ◽  
pp. 664-665
Author(s):  
E.D. Boyes ◽  
P.L. Gai ◽  
D.B. Darby ◽  
C. Warwick
Keyword(s):  
Defect Density ◽  
Chemical Properties ◽  
Operating Conditions ◽  
Semiconductor Materials ◽  
Environmental Cell ◽  
High Resolution Structure ◽  
Commercially Important ◽  
Crystallographic Defects ◽  
Resolution Structure

The extended crystallographic defects introduced into some oxide catalysts under operating conditions may be a consequence and accommodation of the changes produced by the catalytic activity, rather than always being the origin of the reactivity. Operation without such defects has been established for the commercially important tellurium molybdate system. in addition it is clear that the point defect density and the electronic structure can both have a significant influence on the chemical properties and hence on the effectiveness (activity and selectivity) of the material as a catalyst. SEM/probe techniques more commonly applied to semiconductor materials, have been investigated to supplement the information obtained from in-situ environmental cell HVEM, ultra-high resolution structure imaging and more conventional AEM and EPMA chemical microanalysis.

Deriving ultrapure three-dimensional semiconductor materials under space vacuum conditions

2003 ◽  
Vol 8 (5-6) ◽  
pp. 30-32
Author(s):  
B.E. Paton ◽  
◽  
E.A. Asnis ◽  
S.P. Zabolotin ◽  
P.I. Baranskii ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Semiconductor Materials ◽  
Space Vacuum

Investigation of Photoelectric Converters Based on Different Semiconductor Materials

2018 ◽  
Vol 10 (4) ◽  
pp. 04023-1-04023-6 ◽  
Author(s):  
Yu. V. Natarova ◽  
◽  
A. B. Galat ◽  
A. S. Gnatenko ◽  
◽  
...  
Keyword(s):  
Semiconductor Materials ◽  
Photoelectric Converters
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