Optical techniques for in-situ analysis and control of semiconductor crystal growth

1990 ◽  
Author(s):  
David E. Aspnes
Keyword(s):  
Crystal Growth ◽  
In Situ Analysis ◽  
Semiconductor Crystal ◽  
Optical Techniques ◽  
And Control

Application of optical techniques for in situ analysis of plasma facing carbon tiles

2009 ◽  
Vol 390-391 ◽  
pp. 1131-1134 ◽  
Author(s):  
H. Nakazato ◽  
M. Yoshida ◽  
T. Tanabe ◽  
K. Masaki ◽  
N. Miya ◽  
...  
Keyword(s):  
In Situ Analysis ◽  
Optical Techniques

scholarly journals Processing Development and Surface Preparation Review. In-situ Microscopy and Control of Surface Structure and Ambient during Crystal Growth.

Shinku ◽  
1996 ◽  
Vol 39 (11) ◽  
pp. 546-553
Author(s):  
Yuichi KAWAMURA ◽  
Tutomu ARAKI ◽  
Keizou MORIMOTO ◽  
Naohisa INOUE ◽  
Yoshikazu HOMMA ◽  
...  
Keyword(s):  
Crystal Growth ◽  
Surface Structure ◽  
Surface Preparation ◽  
And Control

scholarly journals Nonlinear optical probes of nucleation and crystal growth: recent progress and future prospects

2021 ◽  
Author(s):  
Ahmet R. Dok ◽  
Thibaut Legat ◽  
Yovan de Coene ◽  
M. A. van der Veen ◽  
T. Verbiest ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Crystal Growth ◽  
Nonlinear Optical ◽  
Recent Progress ◽  
Future Prospects ◽  
Optical Probes ◽  
Optical Techniques ◽  
Structure And Morphology

Nonlinear optical techniques are emerging as powerful in-situ probes of crystallization processes due to their inherent sensitivity to crystal structure and morphology.

A computer-control program for TEM in situ fatigue experiments

1989 ◽  
Vol 47 ◽  
pp. 620-621
Author(s):  
Kenneth S. Vecchio ◽  
John A. Hunt
Keyword(s):  
Slow Crack Growth ◽  
Computer Control ◽  
Control Program ◽  
Video Tape ◽  
Computer Control System ◽  
Transmission Electron ◽  
In Situ Experiments ◽  
Tremendous Amount ◽  
And Control

In-situ experiments conducted within a transmission electron microscope provide the operator a unique opportunity to directly observe microstructural phenomena, such as phase transformations and dislocation-precipitate interactions, “as they happen”. However, in-situ experiments usually require a tremendous amount of experimental preparation beforehand, as well as, during the actual experiment. In most cases the researcher must operate and control several pieces of equipment simultaneously. For example, in in-situ deformation experiments, the researcher may have to not only operate the TEM, but also control the straining holder and possibly some recording system such as a video tape machine. When it comes to in-situ fatigue deformation, the experiments became even more complicated with having to control numerous loading cycles while following the slow crack growth. In this paper we will describe a new method for conducting in-situ fatigue experiments using a camputer-controlled tensile straining holder.The tensile straining holder used with computer-control system was manufactured by Philips for the Philips 300 series microscopes. It was necessary to modify the specimen stage area of this holder to work in the Philips 400 series microscopes because the distance between the optic axis and holder airlock is different than in the Philips 300 series microscopes. However, the program and interfacing can easily be modified to work with any goniometer type straining holder which uses a penrmanent magnet motor.

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