Molecular beam static secondary ion mass spectrometry for surface analysis

Mapping Intimacies ◽

10.1117/12.206432 ◽

1995 ◽

Author(s):

Anthony D. Appelhans ◽

Gary S. Groenewold ◽

Jani C. Ingram ◽

D. A. Dahl ◽

J. E. Delmore

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Molecular Beam ◽

Secondary Ion Mass Spectrometry ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Surface analysis of plasma-deposited polymer films by Time of Flight Static Secondary Ion Mass Spectrometry (ToF-SSIMS) before and after exposure to ambient air

Surface and Coatings Technology ◽

10.1016/j.surfcoat.2005.02.032 ◽

2005 ◽

Vol 200 (1-4) ◽

pp. 463-467 ◽

Cited By ~ 23

Author(s):

U. Oran ◽

S. Swaraj ◽

J.F. Friedrich ◽

W.E.S. Unger

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Polymer Films ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Ambient Air ◽

Ion Mass Spectrometry ◽

Before And After ◽

Secondary Ion

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Direct Surface Analysis of Pesticides on Soil, Leaves, Grass, and Stainless Steel by Static Secondary Ion Mass Spectrometry

Environmental Science & Technology ◽

10.1021/es960213h ◽

1997 ◽

Vol 31 (2) ◽

pp. 402-408 ◽

Cited By ~ 24

Author(s):

Jani C. Ingram ◽

Gary S. Groenewold ◽

Anthony D. Appelhans ◽

James E. Delmore ◽

John E. Olson ◽

...

Keyword(s):

Mass Spectrometry ◽

Stainless Steel ◽

Surface Analysis ◽

Secondary Ion Mass Spectrometry ◽

Ion Mass Spectrometry ◽

Secondary Ion

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SURFACE ANALYSIS OF POLYSTYRENE LATEXES BY ION SCATTERING SPECTROSCOPY AND SECONDARY ION MASS SPECTROMETRY

Journal of Dispersion Science and Technology ◽

10.1080/01932698108943913 ◽

1981 ◽

Vol 2 (2-3) ◽

pp. 267-280 ◽

Cited By ~ 7

Author(s):

Charles C. Fifield ◽

Robert M. Fitch

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Surface Analysis of Polymers using Helium Ion Microscopy Coupled with Secondary Ion Mass Spectrometry (HIM-SIMS)

Microscopy and Microanalysis ◽

10.1017/s1431927619005075 ◽

2019 ◽

Vol 25 (S2) ◽

pp. 868-869

Author(s):

Artem A. Trofimov ◽

Matthias Lorenz ◽

Anton Ievlev ◽

Stephen T. King ◽

Olga S. Ovchinnikova ◽

...

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Secondary Ion Mass Spectrometry ◽

Helium Ion ◽

Ion Mass Spectrometry ◽

Ion Microscopy ◽

Secondary Ion

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Time-of-flight secondary ion mass spectrometry (TOF-SIMS):—versatility in chemical and imaging surface analysis

The Analyst ◽

10.1039/b402607c ◽

2004 ◽

Vol 129 (6) ◽

pp. 483-487 ◽

Cited By ~ 195

Author(s):

Rana N. S. Sodhi

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Surface analysis of pyrite in the No. 9 coal seam, Wuda Coalfield, Inner Mongolia, China, using high-resolution time-of-flight secondary ion mass-spectrometry

International Journal of Coal Geology ◽

10.1016/s0166-5162(03)00109-5 ◽

2003 ◽

Vol 55 (2-4) ◽

pp. 139-150 ◽

Cited By ~ 60

Author(s):

Shifeng Dai ◽

Xiaoqiang Hou ◽

Deyi Ren ◽

Yuegang Tang

Keyword(s):

Mass Spectrometry ◽

High Resolution ◽

Coal Seam ◽

Surface Analysis ◽

Inner Mongolia ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Resolution Time ◽

Ion Mass Spectrometry ◽

Secondary Ion

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ChemInform Abstract: Nature of the Passive Film on Fe-Cr Alloys as Studied by 18O Secondary Ion Mass Spectrometry: Reduction of the Prior Film and Stability to ex situ Surface Analysis.

ChemInform ◽

10.1002/chin.199131021 ◽

2010 ◽

Vol 22 (31) ◽

pp. no-no

Author(s):

J. A. BARDWELL ◽

G. I. SPROULE ◽

D. F. MITCHELL ◽

B. MACDOUGALL ◽

M. J. GRAHAM

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Passive Film ◽

Secondary Ion Mass Spectrometry ◽

Ex Situ ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Surface analysis: x-ray photoelectron spectroscopy, Auger electron spectroscopy, and secondary ion mass spectrometry

Analytical Chemistry ◽

10.1021/ac00242a027 ◽

1982 ◽

Vol 54 (5) ◽

pp. 293-322 ◽

Cited By ~ 44

Author(s):

Noel H. Turner ◽

Richard J. Colton

Keyword(s):

Mass Spectrometry ◽

Auger Electron Spectroscopy ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Surface analysis with high energy time-of-flight secondary ion mass spectrometry measured in parallel with PIXE and RBS

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2010.02.045 ◽

2010 ◽

Vol 268 (11-12) ◽

pp. 1714-1717 ◽

Cited By ~ 18

Author(s):

Brian N. Jones ◽

Vladimir Palitsin ◽

Roger Webb

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

High Energy ◽

Ion Mass Spectrometry ◽

Pixe And Rbs ◽

Secondary Ion

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Secondary Ion Mass Spectrometry as Related to Surface Analysis

Encyclopedia of Analytical Chemistry ◽

10.1002/9780470027318.a6016 ◽

2006 ◽

Author(s):

Scott D. Hanton ◽

Paula A. Cornelio Clark

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Secondary Ion Mass Spectrometry ◽

Ion Mass Spectrometry ◽

Secondary Ion

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