Role of the structural domains of linker histones and histone H3 in the chromatin fiber structure at low-ionic strength: scanning force microscopy (SFM) studies on partially trypsinized chromatin

1995 ◽  
Author(s):  
Jordanka Zlatanova ◽  
Sanford S. Leuba ◽  
Carlos J. Bustamante ◽  
Kensal van Holde
Keyword(s):  
Ionic Strength ◽  
Histone H3 ◽  
Scanning Force Microscopy ◽  
Fiber Structure ◽  
Structural Domains ◽  
Linker Histones ◽  
Force Microscopy ◽  
Scanning Force ◽  
Low Ionic Strength

Role of the force of friction on curved surfaces in scanning force microscopy

1995 ◽  
Vol 329 (1-2) ◽  
pp. 149-156 ◽  
Author(s):  
J.P Aimé ◽  
Z Elkaakour ◽  
S Gauthier ◽  
D Michel ◽  
T Bouhacina ◽  
...  
Keyword(s):  
Scanning Force Microscopy ◽  
Curved Surfaces ◽  
Force Microscopy ◽  
Scanning Force

Intermittent contact scanning force microscopy: The role of the liquid necks

1998 ◽  
Vol 72 (26) ◽  
pp. 3461-3463 ◽  
Author(s):  
M. Luna ◽  
J. Colchero ◽  
A. M. Baró
Keyword(s):  
Scanning Force Microscopy ◽  
Force Microscopy ◽  
Scanning Force ◽  
Intermittent Contact

Effect of Self-Assembling Monolayers (SAMs) on Ice Adhesion to Metals

1999 ◽  
Vol 586 ◽  
Author(s):  
S. L. Peng ◽  
V. F. Petrenko ◽  
M. Arakawa
Keyword(s):  
Contact Angle ◽  
Hydrogen Bonding ◽  
Molecular Layer ◽  
Scanning Force Microscopy ◽  
Original Method ◽  
Force Microscopy ◽  
Self Assembling ◽  
Scanning Force ◽  
Ice Adhesion

ABSTRACTIn this research we used an original method to study the role of hydrogen bonding in ice adhesion and to minimize the effect of this mechanism on ice adhesion. We coated metals (Au and Pt) with a mono-molecular layer of specific organic molecules that had either strong hydrophobic properties (CH3(CH2)11SH) or strong hydrophilic properties (OH(CH2)11SH). To determine the contribution of hydrogen bonding to ice adhesion, self-assembling monolayers (SAMs) of varying degrees of hydrophobicity/hydrophilicity were created by mixing the hydrophobic and hydrophilic components. All of the SAMs were composed of similar molecules that differed only in their outermost groups, OH- and CH3-. Thus, when the SAMs were grown on the same substrate (almost atomically smooth metal coatings), any differences in their adhesion to ice were due to differences in the hydrogen bonding between the ice and SAMs. The SAMs structure and quality were examined with scanning force microscopy (SFM) and the degree of the SAM's hydrophobicity/hydrophilicity was characterized by the contact angle of water on the monolayers. We then froze water on the SAMs and measured the shear strength of the ice/SAM/metal interfaces. Possible damage to the interfaces was examined with SFM after the ice had melted. We found a good correlation between the contact angle of water and the ice adhesion strength and determined the fraction of ice adhesion caused by hydrogen bonding.

scholarly journals Linker Histone Tails and N-Tails of Histone H3 Are Redundant: Scanning Force Microscopy Studies of Reconstituted Fibers

1998 ◽  
Vol 74 (6) ◽  
pp. 2830-2839 ◽  
Author(s):  
Sanford H. Leuba ◽  
Carlos Bustamante ◽  
Kensal van Holde ◽  
Jordanka Zlatanova
Keyword(s):  
Histone H3 ◽  
Scanning Force Microscopy ◽  
Linker Histone ◽  
Histone Tails ◽  
Force Microscopy ◽  
Scanning Force

Role of tip contamination in scanning force microscopy imaging of ionic surfaces

1997 ◽  
Vol 106 ◽  
pp. 425-442 ◽  
Author(s):  
Alexander I. Livshits ◽  
and Alexander L. Shluger
Keyword(s):  
Scanning Force Microscopy ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Scanning Force

The role of shear forces in scanning force microscopy: a comparison between the jumping mode and tapping mode

2000 ◽  
Vol 453 (1-3) ◽  
pp. 152-158 ◽  
Author(s):  
F. Moreno-Herrero ◽  
P.J. de Pablo ◽  
J. Colchero ◽  
J. Gómez-Herrero ◽  
A.M. Baró
Keyword(s):  
Scanning Force Microscopy ◽  
Shear Forces ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Scanning Force

Scanned tip measurement of deep vertical facets on a flat surface: Measuring roughness on gaas laser waveguide mirrors

1993 ◽  
Vol 51 ◽  
pp. 532-533
Author(s):  
Chang Shen ◽  
Phil Fraundorf ◽  
Robert W. Harrick
Keyword(s):  
Integrated Circuits ◽  
Flat Surface ◽  
Scanning Force Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Optoelectronic Integrated Circuits ◽  
Laser Waveguide ◽  
Scanning Force ◽  
Gaas Laser

Monolithic integration of optoelectronic integrated circuits (OEIC) requires high quantity etched laser facets which prevent the developing of more-highly-integrated OEIC's. The causes of facet roughness are not well understood, and improvement of facet quality is hampered by the difficulty in measuring the surface roughness. There are several approaches to examining facet roughness qualitatively, such as scanning force microscopy (SFM), scanning tunneling microscopy (STM) and scanning electron microscopy (SEM). The challenge here is to allow more straightforward monitoring of deep vertical etched facets, without the need to cleave out test samples. In this presentation, we show air based STM and SFM images of vertical dry-etched laser facets, and discuss the image acquisition and roughness measurement processes. Our technique does not require precision cleaving. We use a traditional tip instead of the T shape tip used elsewhere to preventing “shower curtain” profiling of the sidewall. We tilt the sample about 30 to 50 degrees to avoid the curtain effect.

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