scholarly journals A novel Region of Interest (ROI) imaging technique for biplane imaging in interventional suites: high-resolution small field-of-view imaging in the frontal plane and dose-reduced, large field-of-view standard-resolution imaging in the lateral plane

2014 ◽  
Author(s):  
Setlur Nagesh Swetadri Vasan ◽  
C. Ionita ◽  
D. R. Bednarek ◽  
Stephen Rudin
Keyword(s):  
High Resolution ◽  
Imaging Technique ◽  
Region Of Interest ◽  
Frontal Plane ◽  
Field Of View ◽  
Large Field ◽  
Small Field ◽  
Lateral Plane ◽  
Resolution Imaging ◽  
Small Field Of View

Very High Resolution Analysis of the Dynamics of a Coronal Plasmoid

1994 ◽  
Vol 144 ◽  
pp. 593-596
Author(s):  
O. Bouchard ◽  
S. Koutchmy ◽  
L. November ◽  
J.-C. Vial ◽  
J. B. Zirker
Keyword(s):  
High Resolution ◽  
Solar Eclipse ◽  
Total Solar Eclipse ◽  
Field Of View ◽  
Small Field ◽  
High Resolution Analysis ◽  
Ccd Observations ◽  
Resolution Analysis ◽  
Very High ◽  
Small Field Of View

AbstractWe present the results of the analysis of a movie taken over a small field of view in the intermediate corona at a spatial resolution of 0.5“, a temporal resolution of 1 s and a spectral passband of 7 nm. These CCD observations were made at the prime focus of the 3.6 m aperture CFHT telescope during the 1991 total solar eclipse.

scholarly journals Visually Guided Microassembly with Active Zooming

2006 ◽  
Vol 18 (6) ◽  
pp. 787-794
Author(s):  
Xiaodong Tao ◽  
◽  
Hyungsuck Cho ◽  
Youngjun Cho ◽  
Keyword(s):  
High Resolution ◽  
Field Of View ◽  
Depth Of Field ◽  
Wide Field ◽  
Small Field ◽  
Depth Of Focus ◽  
Large Depth ◽  
Small Depth ◽  
Wide Field Of View ◽  
Small Field Of View

Vision techniques used in automatic microassembly are limited by inherent problems such as small depth of focus and small field of view. Microassembly must, however, initially detect microparts in a wide field of view and large depth of field while maintaining high resolution. We propose microassembly using active zooming that can overcome these limitations. For a small field of view, active zooming prevents the target from getting out of the field of view during microassembly. For a small depth of focus, our proposal is based on focus measure to maintain clear target image in the field of view during microassembly. Two-step assembly thus ensures zoom microscopy maintaining a wide field of view and large depth of field initially and high resolution at the end. Peg-in-hole assembly experiments confirmed the feasibility of our proposal.

SU-E-I-99: An Ultra-High Resolution Small Field-Of-View Solid State X-Ray Imaging Detector Based on an Electron Multiplying CCD

2012 ◽  
Vol 39 (6Part5) ◽  
pp. 3647-3648
Author(s):  
V Singh ◽  
B Loughran ◽  
A Jain ◽  
P Sharma ◽  
D Bednarek ◽  
...  
Keyword(s):  
Solid State ◽  
High Resolution ◽  
Field Of View ◽  
Small Field ◽  
X Ray ◽  
X Ray Imaging ◽  
Imaging Detector ◽  
Small Field Of View
Sign in / Sign up

Export Citation Format

Share Document