The research of relay lens coupling in image intensified camera

Ball-lens coupling efficiency for laser-diode to single-mode fiber: comparison of independent studies by distinct methods

Applied Optics ◽

10.1364/ao.37.003201 ◽

1998 ◽

Vol 37 (15) ◽

pp. 3201 ◽

Cited By ~ 20

Author(s):

Robert Gale Wilson

Keyword(s):

Laser Diode ◽

Coupling Efficiency ◽

Single Mode ◽

Single Mode Fiber ◽

Lens Coupling

Download Full-text

High-speed multi-beam X-ray imaging using a lens coupling detector system

Applied Physics Express ◽

10.35848/1882-0786/ab9d30 ◽

2020 ◽

Vol 13 (7) ◽

pp. 077002 ◽

Cited By ~ 1

Author(s):

Tetsuroh Shirasawa ◽

Liang Xiaouyu ◽

Wolfgang Voegeli ◽

Etsuo Arakawa ◽

Kentaro Kajiwara ◽

...

Keyword(s):

High Speed ◽

Detector System ◽

X Ray ◽

X Ray Imaging ◽

Lens Coupling

Download Full-text

Electron Decelerator for Improved CCD Performance In Intermediate Voltage Electron Microscopy

Microscopy and Microanalysis ◽

10.1017/s1431927600036163 ◽

2000 ◽

Vol 6 (S2) ◽

pp. 734-735

Author(s):

Kenneth H. Downing ◽

Paola Favia ◽

E. Mooney

Keyword(s):

Electron Scattering ◽

High Performance ◽

Light Output ◽

Ccd Cameras ◽

Electronic Data Collection ◽

Voltage Electron ◽

Resolution Electron ◽

Spread Function ◽

Lens Coupling ◽

Performance Tradeoff

There are many advantages of IVEMs over more conventional microscopes, all of which make it possible to obtain more accurate data at higher resolution. One significant drawback of higher accelerating voltages is degraded performance of the electron detector, a problem that is particularly serious with CCD cameras. At any voltage, one faces a tradeoff with the CCD performance between sensitivity and resolution. Electron scattering within the scintillator and its support broaden the point spread function, while the decreased scattering cross section at higher voltages decreases the light output from the scintillator. At voltages much above 100 kV these effects have been found to seriously limit CCD performance. With the trend towards electronic data collection and microscope automation, it is essential that a high performance detector be developed for the IVEM. One approach to optimizing the performance tradeoff employs lens coupling to improve resolution, at the expense of sensitivity.

Download Full-text