Nanocrystallic thin films statistical structural analysis by the automatic image processing

2013 ◽  
Author(s):  
Maciek Wielgus ◽  
Zofia Sunderland ◽  
Daniel Koguciuk ◽  
Krzysztof Patorski ◽  
Grzegorz Słowik
Keyword(s):  
Thin Films ◽  
Image Processing ◽  
Structural Analysis ◽  
Automatic Image Processing

EMCAT: An automatic image-processing system for electron-microscopic tomography

1994 ◽  
Vol 52 ◽  
pp. 418-419
Author(s):  
Weiping Liu ◽  
John W. Sedat ◽  
David A. Agard
Keyword(s):  
Image Processing ◽  
Structural Information ◽  
Imaging Technique ◽  
Three Dimensional ◽  
Processing System ◽  
Electron Microscopic ◽  
Data Set ◽  
Ordered Structures ◽  
Automatic Image Processing ◽  
Em Tomography

Any real world object is three-dimensional. The principle of tomography, which reconstructs the 3-D structure of an object from its 2-D projections of different view angles has found application in many disciplines. Electron Microscopic (EM) tomography on non-ordered structures (e.g., subcellular structures in biology and non-crystalline structures in material science) has been exercised sporadically in the last twenty years or so. As vital as is the 3-D structural information and with no existing alternative 3-D imaging technique to compete in its high resolution range, the technique to date remains the kingdom of a brave few. Its tedious tasks have been preventing it from being a routine tool. One keyword in promoting its popularity is automation: The data collection has been automated in our lab, which can routinely yield a data set of over 100 projections in the matter of a few hours. Now the image processing part is also automated. Such automations finish the job easier, faster and better.

Structural analysis of Cu 1−x Ag x GaSe 2 bulk materials and thin films

2000 ◽  
Vol 361-362 ◽  
pp. 130-134 ◽  
Author(s):  
M.E Beck ◽  
T Weiss ◽  
D Fischer ◽  
S Fiechter ◽  
A Jäger-Waldau ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Analysis ◽  
Bulk Materials

Optical and structural analysis of plasma-treated and annealed Al–Sb bilayer thin films

Ionics ◽  
2008 ◽  
Vol 15 (2) ◽  
pp. 191-195 ◽  
Author(s):  
S. Inbakumar ◽  
A. Anu kaliani
Keyword(s):  
Thin Films ◽  
Structural Analysis

Transport Characteristics and Structural Analysis of YBa2Cu3O7−x Thin Films Implanted with Argon Ions

1995 ◽  
Vol 147 (1) ◽  
pp. 119-128 ◽  
Author(s):  
Yijie Li ◽  
F. Machalett ◽  
S. Linzen ◽  
F. Schmidl ◽  
P. Seidel
Keyword(s):  
Thin Films ◽  
Structural Analysis ◽  
Argon Ions

Compositional and structural analysis of RF magnetron sputtered La3+-modified PZT thin films

2009 ◽  
Vol 209 (2) ◽  
pp. 991-997 ◽  
Author(s):  
Ravindra Singh ◽  
B.R. Chakraborty ◽  
Nahar Singh ◽  
Harish Bahadur ◽  
T.C. Goel ◽  
...  
Keyword(s):  
Thin Films ◽  
Structural Analysis ◽  
Pzt Thin Films

scholarly journals 3D-structural Analysis of Epitaxially-grown Organic Thin Films by a Newly Developed Energy Dispersive X-ray Diffraction System.

Hyomen Kagaku ◽  
1998 ◽  
Vol 19 (4) ◽  
pp. 259-264
Author(s):  
Kenji ISHIDA ◽  
Toshihisa HORIUCHI ◽  
Kazumi MATSUSHIGE MATSUSHIGE
Keyword(s):  
Thin Films ◽  
Structural Analysis ◽  
Organic Thin Films ◽  
Energy Dispersive ◽  
X Ray Diffraction ◽  
X Ray
Sign in / Sign up

Export Citation Format

Share Document