Development of large-field high-resolution hard x-ray imaging microscopy and microtomography with Fresnel zone plate objective

2013 ◽  
Author(s):  
Yoshio Suzuki ◽  
Akihisa Takeuchi ◽  
Yasuko Terada ◽  
Kentaro Uesugi ◽  
Shigeharu Tamura
Keyword(s):  
High Resolution ◽  
Fresnel Zone ◽  
Zone Plate ◽  
Large Field ◽  
Fresnel Zone Plate ◽  
X Ray ◽  
X Ray Imaging

scholarly journals Large field-of-view X-ray imaging by using a Fresnel zone plate

2012 ◽  
Vol 30 (1) ◽  
pp. 87-93 ◽  
Author(s):  
Xiao-Fang Wang ◽  
Jin-Yu Wang ◽  
Xiao-Hu Chen ◽  
Xin-Gong Chen ◽  
Lai Wei
Keyword(s):  
High Resolution ◽  
Fresnel Zone ◽  
Numerical Study ◽  
Field Of View ◽  
Zone Plate ◽  
Large Field ◽  
Fresnel Zone Plate ◽  
X Rays ◽  
X Ray ◽  
X Ray Imaging

AbstractTo diagnose the implosion of a laser-driven-fusion target such as the symmetry, the hydrodynamic instability at the interface, a high-resolution, large field-of-view kilo-electron-volt X-ray imaging is required. A Kirkpatrick-Baez (K-B) microscope is commonly used, but its field of view is limited to a few hundred microns as the resolution decreases rapidly with the increase of the field of view. A higher resolution could be realized by using a Fresnel zone plate (FZP) for imaging. Presented in this work is a numerical study on the imaging properties of an FZP at Ti-Kα wavelength of 0.275 nm, and a comparison to a K-B imager. It is found that the FZP can realize not only a resolution better than 1 µm, but also a field-of-view larger than 20 mm when the FZP is illuminated by X-rays of spectral bandwidth less than 1.75%. These results indicate the feasibility of applying the FZP in high-resolution, large field-of-view X-ray imaging.

Fast computing method for X-ray imaging by a Fresnel zone plate

2014 ◽  
Vol 26 (2) ◽  
pp. 22003
Author(s):  
张巍巍 Zhang Weiwei ◽  
王晓方 Wang Xiaofang
Keyword(s):  
Fresnel Zone ◽  
Zone Plate ◽  
Fresnel Zone Plate ◽  
X Ray ◽  
X Ray Imaging ◽  
Computing Method

X-ray imaging microscopy using Fresnel zone plate objective and quasimonochromatic undulator radiation

2004 ◽  
Vol 75 (4) ◽  
pp. 1155-1157 ◽  
Author(s):  
Yoshio Suzuki ◽  
Akihisa Takeuchi ◽  
Hidekazu Takano ◽  
Kentaro Uesugi ◽  
Toshihiko Oka ◽  
...  
Keyword(s):  
Fresnel Zone ◽  
Zone Plate ◽  
Fresnel Zone Plate ◽  
Undulator Radiation ◽  
X Ray ◽  
X Ray Imaging

Zernike-type X-ray imaging microscopy at 25 keV with Fresnel zone plate optics

2002 ◽  
Vol 9 (3) ◽  
pp. 125-127 ◽  
Author(s):  
M. Awaji ◽  
Y. Suzuki ◽  
A. Takeuchi ◽  
H. Takano ◽  
N. Kamijo ◽  
...  
Keyword(s):  
Fresnel Zone ◽  
Zone Plate ◽  
Fresnel Zone Plate ◽  
X Ray ◽  
X Ray Imaging

Fresnel zone plate telescopes for X-ray imaging I: experiments with a quasi-parallel beam

2009 ◽  
Vol 24 (1-3) ◽  
pp. 109-126 ◽  
Author(s):  
Sandip K. Chakrabarti ◽  
S. Palit ◽  
D. Debnath ◽  
A. Nandi ◽  
V. Yadav ◽  
...  
Keyword(s):  
Fresnel Zone ◽  
Zone Plate ◽  
Fresnel Zone Plate ◽  
Parallel Beam ◽  
X Ray ◽  
X Ray Imaging

X-ray microscopy at the ALS: Partial coherent image modeling

1994 ◽  
Vol 52 ◽  
pp. 70-71
Author(s):  
L. Jochum ◽  
W. Meyer-Ilse ◽  
H. Medecki ◽  
D. Attwood
Keyword(s):  
High Resolution ◽  
Fresnel Zone ◽  
Zone Plate ◽  
Image Modeling ◽  
X Ray ◽  
Resource Center ◽  
X Ray Imaging ◽  
Coherent Image ◽  
Before And After ◽  
Monochromatic Illumination

A Biological X-ray Microscopy Resource Center is planned to be built at the Advanced Light Source (ALS) in Berkeley. The first instrument will be the High Resolution Zone Plate Microscope (XM-1) installed at the bending magnet beam line 6.12. It will be operational in August 1994. The optical setup of this x-ray microscope is analog to a conventional visible light microscope using critical illumination (Fig. 1). Fresnel zone plates are used for both condenser and high resolution objective. The condenser zone plate illuminates the sample, and at the same time, in combination with a pinhole, acts as a monochromator providing quasi monochromatic illumination. The high resolution objective zone plate is used to create an enlarged image of the sample on a back-illuminated CCD detector. Exposure times for images with 1000 by 1000 pixels are expected to be a few seconds. In order to permit examination of the sample before and after the x-ray imaging, the design of our instrument includes two visiblelight microscopes.

scholarly journals Fresnel zone plate telescopes for X-ray imaging II: numerical simulations with parallel and diverging beams

2009 ◽  
Vol 27 (1-2) ◽  
pp. 77-93 ◽  
Author(s):  
Sourav Palit ◽  
Sandip Kumar Chakrabarti ◽  
Dipak Debnath ◽  
A. R. Rao ◽  
Anuj Nandi ◽  
...  
Keyword(s):  
Numerical Simulations ◽  
Fresnel Zone ◽  
Zone Plate ◽  
Fresnel Zone Plate ◽  
X Ray ◽  
X Ray Imaging

Observation of Precipitates in Aluminium Alloys by Sub-Micrometer Resolution Tomography Using Fresnel Zone Plate

2006 ◽  
Vol 519-521 ◽  
pp. 1361-1366 ◽  
Author(s):  
Hiroyuki Toda ◽  
Keisuke Minami ◽  
Masakazu Kobayashi ◽  
Kentaro Uesugi ◽  
Akihisa Takeuchi ◽  
...  
Keyword(s):  
Volume Fraction ◽  
Fresnel Zone ◽  
Three Dimensional ◽  
Thin Foil ◽  
Zone Plate ◽  
Fresnel Zone Plate ◽  
X Ray ◽  
X Ray Imaging ◽  
Synchrotron Facility ◽  
Resolution Level

An X-ray microtomography combined with hard X-ray imaging microscopy, that potentially has a spatial resolution of the order of 10 to 100 nm, has been applied to the three-dimensional observation of internal microstructural features in overaged Al-Ag alloys. A Fresnel zone plate is used as an objective with a magnification of 49.3 times. Imaging of resolution test patterns has indicated spatial resolutions of around 180 and 200 nm in the vertical and horizontal directions, respectively. This paper reports the first impression of the microstructural imaging by means of such a high-resolution imaging microtomography. Precipitate microstructures are readily observed and quantified in terms of volume fraction and orientation. Conventional microtomography with a simple projection geometry is also applied for comparison purpose at the highest resolution level currently available at a third generation synchrotron facility. It would appear that the present technique provides a unique potential to observe the 3-D geometry and spatial distribution of nanoscopic features inside samples that are several orders of magnitude thicker than thin-foil specimens for TEM observation.

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